TRAINED CLASSIFIERS
Experts
- Jinwoo Shin
- Robert Sabourin
- Loris Nanni
- George Kesidis
- Honglak Lee
- Flávia Cristina Bernardini
- Maria Carolina Monard
- Ronaldo C. Prati
- Araceli Sanchis
- Gianluigi Folino
- Jongheon Jeong
- Zhen Xiang
- Agapito Ledezma
- Boguslaw Cyganek
- Peter I. Rockett
- David J. Miller
- M. Paz Sesmero Lorente
- Somnuk Phon-Amnuaisuk
- Mohammad Esmaeilpour
- Autilia Vitiello
- Marcel van Herk
- Horst Bunke
- Giovanni Acampora
- Abdollah Dehzangi
- Arkanath Pathak
- Sakrapee Paisitkriangkrai
- Ismael C. S. Araujo
- Ioannis P. Vlahavas
- Heung-Chang Lee
- Gonzalo Martínez-Muñoz
- Dilip Krishnan
- Seppo Puuronen
- Se-Ho Choi
- Alexander Logvinovsky
- Dongdong She
- Christian Wöhler
- Michal Kruk
- Sotiris B. Kotsiantis
- Nicholas Dufour
Venues
- CoRR
- IJCNN
- Expert Syst. Appl.
- Neurocomputing
- EuroGP
- ICASSP
- Pattern Recognit.
- IEEE Access
- KES
- Pattern Anal. Appl.
- SMC
- FUZZ-IEEE
- AISTATS
- ECAI
- FLAIRS Conference
- IEEE Trans. Neural Networks
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Neural Comput.
- AAAI
- Medical Imaging: Computer-Aided Diagnosis
- IEEE Congress on Evolutionary Computation
- MILCOM
- Sensors
- Artif. Intell. Rev.
- USENIX Security Symposium
- Comput. Stat. Data Anal.
- CVPR
- J. Biomed. Informatics
- IEEE Trans. Cybern.
- ICPR
- HIS
- EMBC
- ICLR
- Neural Comput. Appl.
- SIGMOD Conference
- NIPS
- ISBI
- WILF
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