TAC SCM
Experts
- Norman M. Sadeh
- Michael P. Wellman
- Peter Stone
- Christopher Kiekintveld
- Michael Benisch
- Amy Greenwald
- John Collins
- Patrick R. Jordan
- David Pardoe
- Jason Miller
- Maria L. Gini
- Alberto Sardinha
- Vedran Podobnik
- Yain-Whar Si
- Wolfgang Ketter
- Eric Sodomka
- Andreas L. Symeonidis
- Ana Petric
- Victor Naroditskiy
- Raghu Arunachalam
- James Andrews
- Doina Precup
- Marlon Dumas
- Gordan Jezic
- Daniel Macías Galindo
- Somchai Limsiroratana
- Niclas Finne
- Toshiya Kaihara
- Ramprasad Ravichandran
- Sverker Janson
- Darnes Vilariño Ayala
- Jürgen Sauer
- Chan U. Chong
- Ioanna Grypari
- Minghua He
- David Edmond
- Roger Lederman
- Mizuho Sato
- Philipp W. Keller
Venues
- Electron. Commer. Res. Appl.
- AAMAS
- AMEC/TADA
- SIGecom Exch.
- TADA/AMEC
- Ann. Oper. Res.
- Comput. Ind. Eng.
- Eur. J. Oper. Res.
- ICEC
- Complex.
- AI Mag.
- Bus. Process. Manag. J.
- Int. J. Prod. Res.
- CIMCA/IAWTIC
- AAAI
- Multim. Tools Appl.
- Comput. Chem. Eng.
- HICSS
- WSC
- AMEC@AAMAS/TADA@IJCAI
- J. Oper. Res. Soc.
- CIA
- Expert Syst. Appl.
- APMS (2)
- Manag. Sci.
- J. Intell. Manuf.
- J. Optim. Theory Appl.
- IEEE Internet Comput.
- Middleware (Companion)
- ISADS
- ICCL
- Comput. Ind.
- IEEE Access
- Comput. Intell.
- CoRR
- PeerJ Comput. Sci.
- MIE
- PACIS
- Manuf. Serv. Oper. Manag.
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