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Experts
- Jesús Angulo
- Isabelle Bloch
- Edward R. Dougherty
- Santiago Velasco-Forero
- Henk J. A. M. Heijmans
- Dan Schonfeld
- Robert M. Haralick
- Junior Barrera
- Hugues Talbot
- Laurent Najman
- Kunal N. Chaudhury
- Pierre Soille
- Etienne E. Kerre
- Cris L. Luengo Hendriks
- Jean Cousty
- Petr Dokládal
- Akira Asano
- Pedro Pina
- Jean Serra
- Wilfried Philips
- Peter Sussner
- Hans-Peter Seidel
- Petros Maragos
- Jamal Atif
- Samy Blusseau
- Makoto Nakashizuka
- Roberto de Alencar Lotufo
- Lixu Gu
- Manuel González Hidalgo
- Toyohisa Kaneko
- Joachim Weickert
- Mohammed Charif-Chefchaouni
- Robert P. Loce
- Ronald Jones
- Ioannis Pitas
- Matthew J. Thurley
- Hendrik Speleers
- Michael Unser
- Christian Ronse
Venues
- ISMM
- CoRR
- IEEE Trans. Image Process.
- ICIP
- Pattern Recognit.
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IGARSS
- Signal Process.
- EUSIPCO
- ICASSP
- J. Math. Imaging Vis.
- Comput. Aided Geom. Des.
- IEEE Access
- ICPR
- IEEE Trans. Medical Imaging
- J. Vis. Commun. Image Represent.
- CVPR
- SIBGRAPI
- IEEE Trans. Geosci. Remote. Sens.
- ISBI
- Comput. Graph. Forum
- ICIP (3)
- Comput. Aided Des.
- J. Electronic Imaging
- Systems and Computers in Japan
- Appl. Math. Comput.
- IEEE Signal Process. Lett.
- J. Approx. Theory
- CAIP
- ICIP (2)
- DGMM
- Real Time Imaging
- J. Comput. Appl. Math.
- Image Vis. Comput.
- Sensors
- ACM Trans. Graph.
- IEEE J. Sel. Top. Signal Process.
- DGCI
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