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Experts
- Anna C. Gilbert
- Jinming Wen
- Byonghyo Shim
- Jian Wang
- Joel A. Tropp
- Christopher J. Rozell
- Jean-François Determe
- Laurent Jacques
- François Horlin
- Marc Moonen
- Jérôme Louveaux
- Laura Rebollo-Neira
- Zhengchun Zhou
- Inderjit S. Dhillon
- Qun Mo
- Guiling Sun
- Alyson K. Fletcher
- Yoshiyuki Kabashima
- Tong Zhang
- Cheng Li
- Ling-Hua Chang
- Mátyás A. Sustik
- Akil Narayan
- Bob L. Sturm
- Simone Brugiapaglia
- Jwo-Yuh Wu
- Karin Schnass
- Liquan Zhao
- Cho-Jui Hsieh
- Maryam Dehghan
- Ali Çivril
- Massoud Babaie-Zadeh
- Pierre Vandergheynst
- Christine Guillemot
- Lars Eldén
- Seokbeop Kwon
- Sundeep Rangan
- Deanna Needell
- El-Hadi Djermoune
Venues
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- IEEE Signal Process. Lett.
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- IEEE Trans. Image Process.
- IEEE Trans. Instrum. Meas.
- J. Math. Imaging Vis.
- VTC Fall
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