SMALL IMAGE PATCHES
Experts
- Michael Elad
- Loïc Denis
- Walter Kellermann
- Sivaram Gopalakrishnan
- Haesol Park
- Haroon Raja
- Florian Enescu
- Waheed U. Bajwa
- Daniele Angioni
- Antoine Deleforge
- Siqi Shen
- Ambra Demontis
- Angelo Sotgiu
- Priyank Kalla
- Florence Tupin
- Luca Demetrio
- Kyoung Mu Lee
- Guy E. Blelloch
- Peyman Milanfar
- Christina M. Graves
- Abuzer Yakaryilmaz
- Fabio Roli
- Maura Pintor
- Yuanhao Wei
- Xin Niu
- Armin Biere
- Battista Biggio
- Andrzej Sluzek
- Andreas Fröhlich
- Hengyue Pan
- Meyer Scetbon
- Charles-Alban Deledalle
- Gergely Kovásznai
- Husheng Guo
- Yufei Xie
- Jianjun Huang
- Chaoyang Liu
- François G. Meyer
- Ju-wook Jang
Venues
- CoRR
- ICIP
- Discret. Math.
- ICASSP
- IGARSS
- Neural Process. Lett.
- Ars Math. Contemp.
- IEEE Trans. Geosci. Remote. Sens.
- J. Nonlinear Sci.
- SIAM J. Imaging Sci.
- Theor. Comput. Sci.
- Comput. Oper. Res.
- IEEE Trans. Autom. Control.
- BIBM
- Eur. J. Oper. Res.
- IEEE Signal Process. Lett.
- CVPR
- ICCAD
- Multim. Tools Appl.
- Eng. Appl. Artif. Intell.
- IEEE Trans. Signal Process.
- DISC
- Int. J. Syst. Assur. Eng. Manag.
- ICPR (4)
- Int. J. Autom. Technol.
- SODA
- DAGM-Symposium
- ACL
- Eur. J. Comb.
- NOF
- BIBE
- PARCO
- NeurIPS
- Pattern Recognit.
- J. Electr. Comput. Eng.
- MMM (2)
- Multim. Syst.
- ACM Southeast Regional Conference
- Integr.
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