QUERY BASED SAMPLING
Experts
- Fabio Crestani
- James P. Callan
- Justin Zobel
- Mark Baillie
- Milad Shokouhi
- Leif Azzopardi
- Xiao Mang Shou
- Yulia A. Shichkina
- Muon Ha
- Shengli Wu
- Minoru Uehara
- Ilya Markov
- Yoshifumi Sakai
- Nobuyoshi Sato
- Falk Scholer
- Henrik Nottelmann
- Yves Rasolofo
- Hideki Mori
- Jacques Savoy
- Grzegorz Skorupa
- Shivendra S. Panwar
- Frank Shipman
- Jong Suk Ahn
- Sidi Mohammed Senouci
- Antoine Doucet
- Wasif Jawad Hussain
- Krisztian Balog
- Tung Nguyen
- Jun'ichi Tsujii
- Michail Salampasis
- Gary A. Monroe
- Radoslaw P. Katarzyniak
- Jieyu Li
- John Yannis Goulermas
- Mark Truran
- Ravikumar Pragada
- Claude Moulin
- James C. French
- Jen-Shiang Kouh
Venues
- SIGIR
- CIKM
- CoRR
- TREC
- ICDCS Workshops
- ECIR
- LSDS-IR@SIGIR
- WISE
- GLOBECOM
- ICCSA (8)
- J. Inf. Sci.
- Infoscale
- LWA
- Int. J. Inf. Commun. Technol.
- EACL (1)
- SPIRE
- Eurographics Multimedia Workshop
- ICCHP
- Inf. Process. Manag.
- CCGRID
- Inf. Retr.
- ECDL
- Int. J. Uncertain. Fuzziness Knowl. Based Syst.
- KES-AMSTA
- TPDL
- ICC
- ACM Symposium on Document Engineering
- RIAO
- DPDS
- HICSS
- NSS
- EURASIP J. Adv. Signal Process.
- 3PGCIC
- EC
- PDP
- LSC@ICMR
- IEEE Access
- Rev. Socionetwork Strateg.
- ACM Trans. Inf. Syst.
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