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Experts
- Feng Lu
- Yunfei Liu
- Yusuke Sugano
- Andreas Bulling
- Rafael Cabeza
- Arantxa Villanueva
- Jinwei Gu
- Xucong Zhang
- Honghai Liu
- Yihua Cheng
- Haofei Wang
- Otmar Hilliges
- Kentaro Takemura
- Sonia Porta
- Enkelejda Kasneci
- Mario Fritz
- Yiwei Bao
- Chen Change Loy
- Sanja Fidler
- Andoni Larumbe-Bergera
- Seonwook Park
- Roberto Valenti
- Dario Cazzato
- Hui Yu
- Pradipta Biswas
- Ashok Veeraraghavan
- Haibin Cai
- Simon Stent
- Bowen Zhang
- Thiago Santini
- Gonzalo Garde
- Akshay Rangesh
- Jérôme Royan
- Rakshit Sunil Kothari
- Yoichi Sato
- Benoît Bossavit
- Ruicong Liu
- Yang Wang
- Shree K. Nayar
Venues
- CoRR
- ETRA
- Sensors
- ICIP
- CVPR
- ETRA Adjunct
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICPR
- Multim. Tools Appl.
- IEEE Access
- AAAI
- CVPR Workshops
- Ecol. Informatics
- VISIGRAPP (4: VISAPP)
- ICCE-TW
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- BMVC
- ICCV Workshops
- IEEE Trans. Image Process.
- Comput. Vis. Image Underst.
- IEEE Trans. Instrum. Meas.
- Int. J. Comput. Vis.
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- Digit. Investig.
- IEEE Trans. Multim.
- IEEE Trans. Cybern.
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- UIST
- ECCV (13)
- MobiSys
- PSIVT
- ACPR
- IEEE J. Solid State Circuits
- FG
- ROBIO
- HCI (2)
- MVA
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