LIGHT CONDITIONS
Experts
- Feng Lu
- Yusuke Sugano
- Yunfei Liu
- Andreas Bulling
- Arantxa Villanueva
- Rafael Cabeza
- Honghai Liu
- Xucong Zhang
- Jinwei Gu
- Haofei Wang
- Yihua Cheng
- Kentaro Takemura
- Otmar Hilliges
- Seonwook Park
- Andoni Larumbe-Bergera
- Sanja Fidler
- Chen Change Loy
- Yiwei Bao
- Mario Fritz
- Enkelejda Kasneci
- Sonia Porta
- Bowen Zhang
- Simon Stent
- Haibin Cai
- Ashok Veeraraghavan
- Pradipta Biswas
- Hui Yu
- Dario Cazzato
- Roberto Valenti
- L. R. D. Murthy
- Sahib Khan
- Nitinraj Nair
- Sara Beery
- Jeff B. Pelz
- Shree K. Nayar
- Amine Kacete
- Theo Gevers
- Yang Wang
- Benoît Bossavit
Venues
- CoRR
- ETRA
- Sensors
- CVPR
- ICIP
- Multim. Tools Appl.
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- ETRA Adjunct
- IEEE Access
- CVPR Workshops
- AAAI
- IEEE Trans. Cybern.
- VISIGRAPP (4: VISAPP)
- Digit. Investig.
- IEEE Trans. Multim.
- IROS
- Int. J. Comput. Vis.
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Image Process.
- Comput. Vis. Image Underst.
- ICME
- ICCV Workshops
- BMVC
- Ecol. Informatics
- ICCE-TW
- ITSC
- Eng. Appl. Artif. Intell.
- LARS/SBR/WRE
- HCI (28)
- SMC
- VLSI Technology and Circuits
- HSI
- Security, Forensics, Steganography, and Watermarking of Multimedia Contents
- Signal Image Video Process.
- SIBGRAPI
- LASCAS
- ICCP
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