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Experts
- Feng Lu
- Andreas Bulling
- Yunfei Liu
- Yusuke Sugano
- Arantxa Villanueva
- Rafael Cabeza
- Haofei Wang
- Yihua Cheng
- Honghai Liu
- Xucong Zhang
- Jinwei Gu
- Otmar Hilliges
- Andoni Larumbe-Bergera
- Seonwook Park
- Sanja Fidler
- Chen Change Loy
- Yiwei Bao
- Mario Fritz
- Enkelejda Kasneci
- Sonia Porta
- Kentaro Takemura
- Sahib Khan
- L. R. D. Murthy
- Sara Beery
- Jeff B. Pelz
- Nitinraj Nair
- Benoît Bossavit
- Ruicong Liu
- Yang Wang
- Shree K. Nayar
- Amine Kacete
- Theo Gevers
- Yoichi Sato
- Jérôme Royan
- Rakshit Sunil Kothari
- Thiago Santini
- Gonzalo Garde
- Akshay Rangesh
- Bowen Zhang
Venues
- CoRR
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- IEEE Trans. Pattern Anal. Mach. Intell.
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- IEEE Trans. Instrum. Meas.
- Int. J. Comput. Vis.
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- PSIVT
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- IEEE J. Solid State Circuits
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- MVA
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