KERNEL INDEPENDENT COMPONENT ANALYSIS
Experts
- Yongzhen Huang
- Mark S. Nixon
- Yasushi Makihara
- Yasushi Yagi
- Saihui Hou
- Joost Vennekens
- Jan Vanthienen
- Simon Vandevelde
- Chunshui Cao
- Shiqi Yu
- John N. Carter
- Tieniu Tan
- Guoying Zhao
- Pratik Chattopadhyay
- Bram Aerts
- Xu Liu
- Maria De Marsico
- Song Wang
- Manuel J. Marín-Jiménez
- Xin Chen
- Fabrizio Maria Maggi
- Alessio Mecca
- Marco Montali
- Qiang Wu
- Marlon Dumas
- Tao Xiang
- Diego Calvanese
- Daigo Muramatsu
- Faruk Hasic
- Liang Wang
- Yen-Wei Chen
- Shibei Meng
- Yang Fu
- Hongyuan Yu
- Mathias Weske
- Sudeep Sarkar
- Shiliang Chen
- Csaba Benedek
- Sanjay Kumar Gupta
Venues
- CoRR
- Multim. Tools Appl.
- Sensors
- IJCNN
- ICIP
- Pattern Recognit.
- CCBR
- RuleML+RR
- IEEE Access
- ICCV
- CVPR
- IEEE Trans. Inf. Forensics Secur.
- Trans. Inst. Meas. Control
- FGR
- ACM Multimedia
- ICB
- IIH-MSP
- CVPR Workshops
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit. Lett.
- BMVC
- AVBPA
- BTAS
- DICTA
- WACV
- IEEE Trans. Instrum. Meas.
- Neurocomputing
- ECCV (1)
- BIOSIG
- ICPR
- IEEE Trans. Cybern.
- IEEE Trans. Multim.
- IJCB
- ISVC (2)
- ISNN (2)
- Business Process Management Workshops
- RuleML (Supplement)
- AAAI
- PReMI
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