HIT OR MISS TRANSFORM
Experts
- Jesús Angulo
- Sébastien Lefèvre
- Nadia Nedjah
- Luiza de Macedo Mourelle
- Yuri Marchetti Tavares
- Stefano Mattoccia
- Santiago Velasco-Forero
- Luigi di Stefano
- Alexandre de Vasconcelos Cardoso
- Daniel Ruiz-Aguilera
- Élodie Puybareau
- Noël Richard
- K. Raghunath Rao
- Kimmo Fredriksson
- Federico Tombari
- Hae Yong Kim
- Jezekiel Ben-Arie
- Alexandre Kirszenberg
- Erchan Aptoula
- Gonzalo Navarro
- Sebastià Massanet
- Guillaume Tochon
- Shai Avidan
- Arnau Mir
- Sidnei Alves de Araújo
- Manuel González Hidalgo
- Nicolae Vizireanu
- Min Xu
- Harald van der Werff
- Venkatesh Krishnan
- Yangyu Fan
- Timothy F. Cootes
- Erik Cuevas
- Tiejia Jiang
- Jing Jin
- Xiaodan Liang
- Nikolas P. Galatsanos
- Abderrahim Elmoataz
- Sin Liang Lim
Venues
- CoRR
- IEEE Trans. Image Process.
- Sensors
- Pattern Recognit.
- EUSIPCO
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit. Lett.
- BMVC
- ICIP
- EMBC
- ICPR
- ISMM
- CVPR
- ICDSC
- Mach. Vis. Appl.
- IGARSS
- ICPR (3)
- ICPR (2)
- Image Vis. Comput.
- ICME
- IEEE Trans. Circuits Syst. II Express Briefs
- J. Electronic Imaging
- ICIP (1)
- Comput. Electron. Agric.
- IbPRIA (1)
- IEEE J. Sel. Top. Signal Process.
- SII
- ICASSP
- VISAPP (2)
- ICCV
- J. Robotics Mechatronics
- AMDO
- IEEE Trans. Medical Imaging
- J. Math. Imaging Vis.
- IIKI
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Biol. Medicine
- ISBI
- FUSION
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