HIT OR MISS TRANSFORM
Experts
- Jesús Angulo
- Sébastien Lefèvre
- Nadia Nedjah
- Luiza de Macedo Mourelle
- Yuri Marchetti Tavares
- Santiago Velasco-Forero
- Stefano Mattoccia
- Luigi di Stefano
- Alexandre de Vasconcelos Cardoso
- K. Raghunath Rao
- Noël Richard
- Federico Tombari
- Gonzalo Navarro
- Manuel González Hidalgo
- Élodie Puybareau
- Jezekiel Ben-Arie
- Arnau Mir
- Daniel Ruiz-Aguilera
- Guillaume Tochon
- Erchan Aptoula
- Alexandre Kirszenberg
- Sidnei Alves de Araújo
- Kimmo Fredriksson
- Hae Yong Kim
- Sebastià Massanet
- Shai Avidan
- Zheru Chi
- Jun-Wei Hsieh
- Abderrahim Elmoataz
- Nikolas P. Galatsanos
- Yangyu Fan
- Tianyao Ji
- Erik Cuevas
- M. Brandon Westover
- Timothy F. Cootes
- Kaiwen Wang
- Veli Mäkinen
- Jiarui Xu
- Xiangrui Zeng
Venues
- CoRR
- IEEE Trans. Image Process.
- EUSIPCO
- Pattern Recognit.
- Sensors
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICIP
- EMBC
- BMVC
- CVPR
- ICPR
- ISMM
- ICPR (3)
- Mach. Vis. Appl.
- IGARSS
- ICPR (2)
- ICDSC
- J. Math. Imaging Vis.
- VISAPP (2)
- FUSION
- ICASSP
- J. Robotics Mechatronics
- Image Processing: Algorithms and Systems
- SII
- ICME
- IEEE Trans. Medical Imaging
- IIKI
- IEEE Trans. Circuits Syst. II Express Briefs
- J. Electronic Imaging
- IbPRIA (1)
- J. Vis. Commun. Image Represent.
- LASCAS
- ICCV
- ISBI
- MVA
- Int. J. Model. Identif. Control.
- IEEE J. Sel. Top. Signal Process.
- ISCAS
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