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Experts
- Li Liu
- Paul W. Fieguth
- Matti Pietikäinen
- Bhabatosh Chanda
- Yongsheng Dong
- Francesco Bianconi
- Dipak Kumar Ghosh
- Wen Gao
- Bidyut B. Chaudhuri
- Swalpa Kumar Roy
- Ling-Yu Duan
- Antonio Fernández
- Jinwen Ma
- Shiv Ram Dubey
- Lintao Zheng
- Alain Trémeau
- David M. Chen
- André Ricardo Backes
- Damien Muselet
- Odemir Martinez Bruno
- Yo Horikawa
- Yee-Hong Yang
- Barbara Hammer
- Elena González
- Yuwei Wu
- Nicolas Vandenbroucke
- Chen Chen
- Sanjay Kalra
- Jie Lin
- Yen-Yu Lin
- Shutao Li
- Sam S. Tsai
- Radek Grzeszczuk
- Alexander Schulz
- Jie Chen
- Yassine Ruichek
- Jarbas Joaci de Mesquita Sá Junior
- Rouzbeh Maani
- Bernd Girod
Venues
- CoRR
- ICIP
- Pattern Recognit.
- Pattern Recognit. Lett.
- IEEE Access
- Multim. Tools Appl.
- ICASSP
- Sensors
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- INTERSPEECH
- IEEE Trans. Image Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Electronic Imaging
- Vis. Comput.
- Neurocomputing
- Expert Syst. Appl.
- IGARSS
- BMVC
- Remote. Sens.
- Int. J. Pattern Recognit. Artif. Intell.
- ACM Multimedia
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- Image Vis. Comput.
- ICDAR
- ICIAR
- Eng. Appl. Artif. Intell.
- EMBC
- J. Chem. Inf. Comput. Sci.
- ICCV
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- IEEE Trans. Multim.
- J. Vis. Commun. Image Represent.
- ICIP (3)
- Bioinform.
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- CVPR Workshops
- AAAI
- IEEE Geosci. Remote. Sens. Lett.
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