HIGHLY DISCRIMINATIVE
Experts
- Li Liu
- Paul W. Fieguth
- Matti Pietikäinen
- Bhabatosh Chanda
- Yongsheng Dong
- Wen Gao
- Swalpa Kumar Roy
- Francesco Bianconi
- Bidyut B. Chaudhuri
- Dipak Kumar Ghosh
- Ling-Yu Duan
- Jinwen Ma
- André Ricardo Backes
- Alain Trémeau
- David M. Chen
- Shiv Ram Dubey
- Damien Muselet
- Lintao Zheng
- Odemir Martinez Bruno
- Antonio Fernández
- Vijay Chandrasekhar
- Bernd Girod
- Yassine Ruichek
- Sanjay Kalra
- Guoying Zhao
- Alice Porebski
- Yee-Hong Yang
- Shutao Li
- Issam El Khadiri
- Jarbas Joaci de Mesquita Sá Junior
- Brian C. Lovell
- Nicolas Vandenbroucke
- Jiexin Pu
- Elena González
- Rouzbeh Maani
- Chih-Cheng Hung
- Jiawei Han
- Jie Lin
- Xiaohu Song
Venues
- CoRR
- ICIP
- Pattern Recognit.
- Pattern Recognit. Lett.
- Multim. Tools Appl.
- IEEE Access
- ICASSP
- Sensors
- CVPR
- ICPR
- INTERSPEECH
- IEEE Trans. Image Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Electronic Imaging
- Vis. Comput.
- Neurocomputing
- IGARSS
- Expert Syst. Appl.
- Remote. Sens.
- BMVC
- Image Vis. Comput.
- Int. J. Pattern Recognit. Artif. Intell.
- ACM Multimedia
- IROS
- ICDAR
- ICIAR
- Eng. Appl. Artif. Intell.
- EMBC
- Bioinform.
- J. Vis. Commun. Image Represent.
- CVPR Workshops
- MVA
- AAAI
- Inf. Sci.
- IEEE Signal Process. Lett.
- IEEE Trans. Geosci. Remote. Sens.
- ICCV
- SIU
- IEEE Trans. Multim.
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