HIGHLY DISCRIMINATIVE
Experts
- Li Liu
- Paul W. Fieguth
- Bhabatosh Chanda
- Matti Pietikäinen
- Yongsheng Dong
- Ling-Yu Duan
- Bidyut B. Chaudhuri
- Swalpa Kumar Roy
- Francesco Bianconi
- Wen Gao
- Dipak Kumar Ghosh
- Antonio Fernández
- Odemir Martinez Bruno
- Damien Muselet
- David M. Chen
- Jinwen Ma
- André Ricardo Backes
- Shiv Ram Dubey
- Alain Trémeau
- Lintao Zheng
- Nicolas Vandenbroucke
- Jie Lin
- Vijay Chandrasekhar
- Yassine Ruichek
- Xiaohu Song
- Elena González
- Bernd Girod
- Yo Horikawa
- Yen-Yu Lin
- Alexander Schulz
- Brian C. Lovell
- Jiexin Pu
- Jie Chen
- Chen Chen
- Sam S. Tsai
- Radek Grzeszczuk
- Yee-Hong Yang
- Shutao Li
- Chih-Cheng Hung
Venues
- CoRR
- ICIP
- Pattern Recognit.
- Pattern Recognit. Lett.
- IEEE Access
- Multim. Tools Appl.
- ICASSP
- Sensors
- CVPR
- INTERSPEECH
- IEEE Trans. Image Process.
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Electronic Imaging
- Vis. Comput.
- Expert Syst. Appl.
- Neurocomputing
- IGARSS
- BMVC
- Remote. Sens.
- IROS
- Image Vis. Comput.
- Int. J. Pattern Recognit. Artif. Intell.
- ACM Multimedia
- Eng. Appl. Artif. Intell.
- ICDAR
- ICIAR
- EMBC
- J. Chem. Inf. Comput. Sci.
- J. Vis. Commun. Image Represent.
- SIU
- CVPR Workshops
- MVA
- IEEE Trans. Multim.
- ICIP (3)
- ICCV
- WACV
- Bioinform.
- Inf. Sci.
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