FOREGROUND DETECTION
Experts
- Thierry Bouwmans
- Ezequiel López-Rubio
- Sajid Javed
- Soon Ki Jung
- Senem Velipasalar
- François Berry
- Brian C. Lovell
- Miguel A. Molina-Cabello
- Marc Van Droogenbroeck
- Mauricio Casares
- Conrad Sanderson
- Bernhard Rinner
- Vikas Reddy
- Richard P. Kleihorst
- Marc Braham
- Chunxia Xiao
- Rafael M. Luque-Baena
- Jin Tang
- Ling Zhang
- Chenglong Li
- Rin-Ichiro Taniguchi
- Enrique Domínguez
- Dimitris Samaras
- Jocelyn Sérot
- Atsushi Shimada
- Jorge García-González
- Jordi Gonzàlez
- Rafael Marcos Luque Baena
- Deyu Meng
- Q. M. Jonathan Wu
- Yuji Iwahori
- Tsubasa Minematsu
- Dong Liang
- Kang-Hyun Jo
- Alessandro Lanza
- Juan C. SanMiguel
- Andrews Sobral
- Luigi di Stefano
- Synh Viet-Uyen Ha
Venues
- CoRR
- ICIP
- ICDSC
- ICASSP
- IEEE Trans. Image Process.
- AVSS
- ICPR
- Sensors
- IEEE Trans. Circuits Syst. Video Technol.
- CVPR
- IEEE Access
- ICCV
- Multim. Tools Appl.
- ICME
- Neurocomputing
- Comput. Vis. Image Underst.
- WACV
- Pattern Recognit.
- CVPR Workshops
- J. Real Time Image Process.
- IEEE Trans. Multim.
- Pattern Recognit. Lett.
- IEEE Signal Process. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Mach. Vis. Appl.
- VCIP
- IGARSS
- IEEE Trans. Intell. Transp. Syst.
- MVA
- 计算机科学
- ACCV (3)
- IET Image Process.
- Expert Syst. Appl.
- VSSN@MM
- SMC
- ACCV Workshops (1)
- MMSP
- ISVC (2)
- EURASIP J. Adv. Signal Process.
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