FIT IN MAIN MEMORY
Experts
- Stratos Idreos
- Philippe Cudré-Mauroux
- Samuel Madden
- Martin Grund
- Alfons Kemper
- Bruce R. Childers
- Rami G. Melhem
- Su-Kyung Yoon
- Jens Krüger
- Hasso Plattner
- Shin-Dug Kim
- Liang Shi
- Chun Jason Xue
- Thomas Neumann
- Daniel Mossé
- Michel Auguin
- Eamonn J. Keogh
- Jinglei Ren
- Eduard Ayguadé
- Liang Li
- Hamed Farbeh
- Marcus Paradies
- Hector Gonzalez
- Christian Hakert
- Stefan Manegold
- Cécile Belleudy
- Xuechen Zhang
- Qingyuan Deng
- Kenneth A. Ross
- Paul R. Genssler
- Lei Chen
- Thomas Moscibroda
- Sung Kyu Park
- Nooshin Mahdavi
- Leying Chen
- Anastasios Noulas
- Le Gruenwald
- Guoren Wang
- Sangyeun Cho
Venues
- CoRR
- SIGMOD Conference
- Proc. VLDB Endow.
- IEEE Trans. Knowl. Data Eng.
- DEXA
- ICDE Workshops
- IEEE Micro
- EDBT
- ADBIS
- Future Gener. Comput. Syst.
- MEMSYS
- IEEE Access
- ICDE
- SC
- ASPLOS
- DATE
- DAC
- J. Supercomput.
- IWDM
- CIKM
- ICCD
- Int. CMG Conference
- SAC
- ICEIS (2)
- Computer
- DASFAA
- CIDR
- Des. Autom. Embed. Syst.
- MD
- IEEE Trans. Signal Process.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IGARSS
- Jerusalem Conference on Information Technology
- ACM Trans. Archit. Code Optim.
- IEEE Trans. Very Large Scale Integr. Syst.
- RTCSA
- PDCAT
- XSym
- IDEAL
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