FACIAL SURFACE NORMALS
Experts
- Edwin R. Hancock
- William A. P. Smith
- Philip L. Worthington
- Jing Wu
- Hossein Ragheb
- Emmanuel Prados
- Jean-Denis Durou
- Paul Dupuis
- Alfred M. Bruckstein
- Wen Liu
- Alain Crouzil
- Fumio Yamazaki
- John Oliensis
- Olivier D. Faugeras
- Kwang Nam Choi
- Fabio Sartori
- José R. A. Torreão
- Rui Huang
- Suzanne K. Lewis
- Kay Wohlfarth
- Alexander Nisenboim
- Ahmad Shahrizan Abdul Ghani
- Dimitrios Konstantinidis
- Sumit Gupta
- Darryl N. Davis
- Mebarka Belahcene
- Moritz Tenthoff
- Frédéric Courteille
- Josué Ruano
- Xavier Descombes
- Chew Lim Tan
- Jinwei Gu
- Yvain Quéau
- Berthold K. P. Horn
- Edward J. Ciaccio
- Feng Dong
- Elisabeth Rouy
- Kiho Fujii
- Kuntal Sengupta
Venues
- Pattern Recognit.
- CVPR
- ICIP
- BMVC
- ECCV (2)
- SSPR/SPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- IMA Conference on the Mathematics of Surfaces
- IGARSS
- VISAPP (2)
- CoRR
- J. Imaging
- J. Math. Imaging Vis.
- SIBGRAPI
- IEEE Trans. Geosci. Remote. Sens.
- Int. J. Imaging Syst. Technol.
- Int. J. Comput. Vis.
- Image Vis. Comput.
- Comput. Vis. Graph. Image Process.
- AsiaSim (1)
- ICIP (2)
- Int. J. Comput. Math.
- Pattern Anal. Appl.
- Comput. Methods Programs Biomed.
- CAIP
- ICPR (1)
- Pattern Recognit. Lett.
- TAROS
- CVPR Workshops
- ECCV (1)
- TFCV
- Remote. Sens.
- Artif. Intell.
- DGCI
- IbPRIA (1)
- J. Comput. Sci. Technol.
- ISPA
- SMAP
- Int. J. Intell. Syst. Technol. Appl.
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