FACIAL SURFACE NORMALS
Experts
- Edwin R. Hancock
- Philip L. Worthington
- William A. P. Smith
- Jean-Denis Durou
- Jing Wu
- Hossein Ragheb
- Emmanuel Prados
- Wen Liu
- Paul Dupuis
- Fumio Yamazaki
- José R. A. Torreão
- John Oliensis
- Olivier D. Faugeras
- Fabio Sartori
- Rui Huang
- Alain Crouzil
- Alfred M. Bruckstein
- Kwang Nam Choi
- Tianzi Jiang
- Takashi Nonaka
- Stephan R. Richter
- Kay Wohlfarth
- Josué Ruano
- V. S. Fain
- Govind Bhagat
- Katsushi Ikeuchi
- Emiliano Cristiani
- Feng Dong
- Christian Wöhler
- Yee-Hong Yang
- Ning Zhang
- Benoit Huet
- Suren Jayasuriya
- Alexander Nisenboim
- Chao Wang
- Yvain Quéau
- Moritz Tenthoff
- Mebarka Belahcene
- Darryl N. Davis
Venues
- Pattern Recognit.
- CVPR
- SSPR/SPR
- ECCV (2)
- ICIP
- BMVC
- IGARSS
- IMA Conference on the Mathematics of Surfaces
- CoRR
- J. Math. Imaging Vis.
- VISAPP (2)
- J. Imaging
- IEEE Trans. Pattern Anal. Mach. Intell.
- Int. J. Comput. Math.
- Int. J. Comput. Vis.
- Comput. Vis. Graph. Image Process.
- Mach. Vis. Appl.
- Pattern Anal. Appl.
- TAROS
- CVPR Workshops
- Int. J. Imaging Syst. Technol.
- IJCAI
- Comput. Methods Programs Biomed.
- IEEE Geosci. Remote. Sens. Lett.
- ICPR
- ISNN (2)
- Pattern Recognit. Lett.
- TFCV
- DGCI
- Image Vis. Comput.
- ECCV (1)
- ICPR (1)
- J. Comput. Sci. Technol.
- ICIP (2)
- CAIP
- SIBGRAPI
- ISPA
- IEEE Trans. Geosci. Remote. Sens.
- ICCE-Berlin
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