FACIAL SURFACE NORMALS
Experts
- Edwin R. Hancock
- Philip L. Worthington
- William A. P. Smith
- Jing Wu
- Emmanuel Prados
- Jean-Denis Durou
- Hossein Ragheb
- Alain Crouzil
- Kwang Nam Choi
- Wen Liu
- Olivier D. Faugeras
- Alfred M. Bruckstein
- Fumio Yamazaki
- Fabio Sartori
- Rui Huang
- José R. A. Torreão
- John Oliensis
- Paul Dupuis
- Tianzi Jiang
- Chew Lim Tan
- Gerhard Krieger
- Tom S. F. Haines
- John Folkesson
- Edward J. Ciaccio
- Sang Uk Lee
- Dimitrios Konstantinidis
- Benoit Huet
- Ju Yong Chang
- Daniel Cremers
- Ryszard Kozera
- Wei-Shi Zheng
- Elisabeth Rouy
- Ning Zhang
- Sumit Gupta
- Timo Aila
- Suren Jayasuriya
- Katsushi Ikeuchi
- Ady Ecker
- Allan D. Jepson
Venues
- Pattern Recognit.
- CVPR
- ICIP
- BMVC
- SSPR/SPR
- ECCV (2)
- J. Imaging
- CoRR
- IMA Conference on the Mathematics of Surfaces
- IGARSS
- J. Math. Imaging Vis.
- VISAPP (2)
- IEEE Trans. Pattern Anal. Mach. Intell.
- ISNN (2)
- ICPR (1)
- SMAP
- Int. J. Comput. Vis.
- CAIP
- SIBGRAPI
- ICPR
- Int. J. Comput. Math.
- ISPA
- ICIP (2)
- Int. J. Intell. Syst. Technol. Appl.
- VLSM
- Remote. Sens.
- TAROS
- AsiaSim (1)
- Comput. Medical Imaging Graph.
- Int. J. Imaging Syst. Technol.
- Comput. Vis. Graph. Image Process.
- ICIAR
- IEEE Geosci. Remote. Sens. Lett.
- Mach. Vis. Appl.
- J. Comput. Sci. Technol.
- IEEE Trans. Geosci. Remote. Sens.
- Pattern Recognit. Lett.
- Pattern Anal. Appl.
- CVGIP Image Underst.
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