FACIAL SURFACE NORMALS
Experts
- Edwin R. Hancock
- William A. P. Smith
- Philip L. Worthington
- Hossein Ragheb
- Jing Wu
- Jean-Denis Durou
- Emmanuel Prados
- José R. A. Torreão
- Fumio Yamazaki
- Paul Dupuis
- Wen Liu
- Kwang Nam Choi
- Alfred M. Bruckstein
- Alain Crouzil
- Rui Huang
- Fabio Sartori
- John Oliensis
- Olivier D. Faugeras
- Reza Shirvany
- Ammar Chouchane
- Richard Szeliski
- Orazio Gallo
- Michal Kawulok
- Eduardo Romero
- Antoine Manzanera
- Prabir Burman
- Chew Lim Tan
- Xi Chen
- Lei Yang
- A. G. Jones
- Domenico Vitulano
- João L. Fernandes
- Sanjay Bakshi
- Nils Bore
- Kyoung Mu Lee
- Silvia Tozza
- Oliver Vogel
- Vasileios Argyriou
- Christina A. Tennyson
Venues
- Pattern Recognit.
- CVPR
- ECCV (2)
- SSPR/SPR
- ICIP
- BMVC
- J. Math. Imaging Vis.
- CoRR
- IMA Conference on the Mathematics of Surfaces
- IEEE Trans. Pattern Anal. Mach. Intell.
- IGARSS
- J. Imaging
- VISAPP (2)
- ISNN (2)
- Pattern Recognit. Lett.
- TFCV
- ICPR (1)
- DGCI
- Image Vis. Comput.
- ECCV (1)
- ICPR
- IEEE Geosci. Remote. Sens. Lett.
- CAIP
- SIBGRAPI
- Int. J. Imaging Syst. Technol.
- Comput. Medical Imaging Graph.
- Comput. Methods Programs Biomed.
- Int. J. Comput. Vis.
- Mach. Vis. Appl.
- Comput. Vis. Graph. Image Process.
- Pattern Anal. Appl.
- TAROS
- CVPR Workshops
- IJCAI
- AsiaSim (1)
- Int. J. Intell. Syst. Technol. Appl.
- VLSM
- Artif. Intell.
- Int. J. Comput. Math.
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