FACIAL SURFACE NORMALS
Experts
- Edwin R. Hancock
- Philip L. Worthington
- William A. P. Smith
- Jean-Denis Durou
- Emmanuel Prados
- Hossein Ragheb
- Jing Wu
- Rui Huang
- José R. A. Torreão
- Fabio Sartori
- Kwang Nam Choi
- Olivier D. Faugeras
- John Oliensis
- Fumio Yamazaki
- Alain Crouzil
- Alfred M. Bruckstein
- Wen Liu
- Paul Dupuis
- Ping Hao
- Prabir Burman
- Martín Gómez
- Yee-Hong Yang
- Ammar Chouchane
- Nikos Grammalidis
- Stefan Roth
- Lei Yang
- David J. Evans
- Nils Bore
- Silvia Tozza
- Sateesha G. Nadabar
- Oliver Vogel
- Jean Mélou
- Sanjay Bakshi
- Hong Zhang
- Timo Aila
- Fabien Castan
- Chao Wang
- Jianfang Hu
- Jiegu Li
Venues
- Pattern Recognit.
- CVPR
- SSPR/SPR
- BMVC
- ECCV (2)
- ICIP
- J. Imaging
- J. Math. Imaging Vis.
- VISAPP (2)
- CoRR
- IMA Conference on the Mathematics of Surfaces
- IEEE Trans. Pattern Anal. Mach. Intell.
- IGARSS
- Int. J. Comput. Math.
- Pattern Anal. Appl.
- Comput. Methods Programs Biomed.
- AAAI
- Comput. Medical Imaging Graph.
- ISNN (2)
- VLSM
- ICIAR
- SIBGRAPI
- IEEE Trans. Geosci. Remote. Sens.
- CVPR Workshops
- Remote. Sens.
- ISPA
- SMAP
- Int. J. Intell. Syst. Technol. Appl.
- Mach. Vis. Appl.
- ICCE-Berlin
- IEEE Geosci. Remote. Sens. Lett.
- CVGIP Image Underst.
- IJCAI
- ICPR
- Pattern Recognit. Lett.
- CAIP
- ICPR (1)
- Artif. Intell.
- TFCV
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