FACIAL SURFACE NORMALS
Experts
- Edwin R. Hancock
- Philip L. Worthington
- William A. P. Smith
- Emmanuel Prados
- Jing Wu
- Jean-Denis Durou
- Hossein Ragheb
- Fabio Sartori
- José R. A. Torreão
- John Oliensis
- Olivier D. Faugeras
- Alfred M. Bruckstein
- Wen Liu
- Kwang Nam Choi
- Alain Crouzil
- Rui Huang
- Paul Dupuis
- Fumio Yamazaki
- Yanping Deng
- Dongbin Chen
- Stefano Soatto
- Michael J. Brooks
- Jean-Yves Tourneret
- Jiegu Li
- Li Zhang
- András Hajdu
- Edward J. Ciaccio
- Pierre Gurdjos
- David J. Evans
- Allan D. Jepson
- Tadashi Sasagawa
- Stefan Roth
- Marcel Hess
- Fabio Camilli
- Nor Ashidi Mat Isa
- Tom S. F. Haines
- Fabien Castan
- Elisabeth Rouy
- Michele Martone
Venues
- Pattern Recognit.
- CVPR
- ECCV (2)
- SSPR/SPR
- ICIP
- BMVC
- J. Math. Imaging Vis.
- CoRR
- IMA Conference on the Mathematics of Surfaces
- IEEE Trans. Pattern Anal. Mach. Intell.
- IGARSS
- J. Imaging
- VISAPP (2)
- ISNN (2)
- TFCV
- ECCV (1)
- ICPR (1)
- Image Vis. Comput.
- Pattern Recognit. Lett.
- DGCI
- ICPR
- IEEE Geosci. Remote. Sens. Lett.
- CAIP
- SIBGRAPI
- Int. J. Imaging Syst. Technol.
- Comput. Medical Imaging Graph.
- Comput. Methods Programs Biomed.
- Int. J. Comput. Vis.
- Comput. Vis. Graph. Image Process.
- Mach. Vis. Appl.
- Pattern Anal. Appl.
- TAROS
- CVPR Workshops
- IJCAI
- AsiaSim (1)
- Int. J. Intell. Syst. Technol. Appl.
- VLSM
- Artif. Intell.
- Int. J. Comput. Math.
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