FACIAL NEEDLE MAPS
Experts
- Edwin R. Hancock
- William A. P. Smith
- Jing Wu
- Modesto Castrillón Santana
- Juan E. Tapia
- Javier Lorenzo-Navarro
- Yunhong Wang
- Imran Siddiqi
- Chawki Djeddi
- Karl Ricanek
- Enrique Ramón-Balmaseda
- Claudio A. Perez
- Hazim Kemal Ekenel
- Christoph Busch
- Mohamed Daoudi
- Boulbaba Ben Amor
- Changyin Sun
- Qing Tian
- Ciriaco Andrea D'Angelo
- Abdeljalil Gattal
- Ajita Rattani
- Giovanni Abramo
- Cuixian Chen
- Ming-Hsuan Yang
- Tal Arbel
- Yoshio Iwai
- Maodi Hu
- Haizhou Ai
- Baback Moghaddam
- Wankou Yang
- Masashi Nishiyama
- Bao-Liang Lu
- Yishi Wang
- Rajendra S. Gad
- Baiqiang Xia
- Kiran B. Raja
- Ramón Alberto Mollineda
- Abdesselam Bouzerdoum
- Mircea Nicolescu
Venues
- CoRR
- ICPR
- INTERSPEECH
- Multim. Tools Appl.
- CLEF (Working Notes)
- CVPR Workshops
- Pattern Recognit.
- Pattern Recognit. Lett.
- ICIP
- Neural Comput. Appl.
- J. Electronic Imaging
- IEEE Access
- IJCNN
- IET Biom.
- Image Vis. Comput.
- CIARP
- Manag. Sci.
- IJCB
- Pattern Anal. Appl.
- ICASSP
- ICCV Workshops
- Comput. Hum. Behav.
- IEEE Trans. Inf. Forensics Secur.
- Scientometrics
- Expert Syst. Appl.
- Neurocomputing
- SIBGRAPI
- ICB
- Sensors
- WACV
- SIU
- BIOSIG
- Inf. Sci.
- Biomed. Signal Process. Control.
- Mensch & Computer Workshopband
- BMVC
- ISNN (2)
- ISTAS
- IEEE BigData
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