FACIAL NEEDLE MAPS
Experts
- Edwin R. Hancock
- William A. P. Smith
- Jing Wu
- Modesto Castrillón Santana
- Juan E. Tapia
- Yunhong Wang
- Javier Lorenzo-Navarro
- Karl Ricanek
- Enrique Ramón-Balmaseda
- Chawki Djeddi
- Imran Siddiqi
- Mohamed Daoudi
- Hazim Kemal Ekenel
- Boulbaba Ben Amor
- Claudio A. Perez
- Christoph Busch
- Cuixian Chen
- Changyin Sun
- Abdeljalil Gattal
- Ajita Rattani
- Giovanni Abramo
- Ciriaco Andrea D'Angelo
- Qing Tian
- Dogucan Yaman
- Serestina Viriri
- Li Lu
- Kiran B. Raja
- Baback Moghaddam
- Haizhou Ai
- Sebastian Lapuschkin
- Mircea Nicolescu
- Baiqiang Xia
- James J. Clark
- Yoshio Iwai
- Narayan Vetrekar
- Maodi Hu
- Wojciech Samek
- Ming-Hsuan Yang
- Tal Arbel
Venues
- CoRR
- ICPR
- INTERSPEECH
- Multim. Tools Appl.
- CLEF (Working Notes)
- CVPR Workshops
- IEEE Access
- J. Electronic Imaging
- IJCNN
- ICIP
- Pattern Recognit.
- Pattern Recognit. Lett.
- Neural Comput. Appl.
- IJCB
- Pattern Anal. Appl.
- ICASSP
- CIARP
- Manag. Sci.
- Image Vis. Comput.
- IET Biom.
- Expert Syst. Appl.
- SIBGRAPI
- SIU
- IEEE Trans. Inf. Forensics Secur.
- WACV
- Neurocomputing
- Scientometrics
- ICB
- Sensors
- ICCV Workshops
- Comput. Hum. Behav.
- J. Vis. Commun. Image Represent.
- ICCCS
- SITIS
- CIU
- ICPR (3)
- CCBR
- IC3
- AI Soc.
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