FACIAL NEEDLE MAPS
Experts
- Edwin R. Hancock
- William A. P. Smith
- Jing Wu
- Modesto Castrillón Santana
- Juan E. Tapia
- Javier Lorenzo-Navarro
- Yunhong Wang
- Imran Siddiqi
- Karl Ricanek
- Enrique Ramón-Balmaseda
- Chawki Djeddi
- Boulbaba Ben Amor
- Hazim Kemal Ekenel
- Christoph Busch
- Mohamed Daoudi
- Claudio A. Perez
- Qing Tian
- Cuixian Chen
- Giovanni Abramo
- Changyin Sun
- Ajita Rattani
- Abdeljalil Gattal
- Ciriaco Andrea D'Angelo
- Fevziye Irem Eyiokur
- Maodi Hu
- Eileen M. Trauth
- Sebastian Lapuschkin
- Kiran B. Raja
- Dogucan Yaman
- Haizhou Ai
- Tal Arbel
- James J. Clark
- Baiqiang Xia
- Rajendra S. Gad
- Mircea Nicolescu
- Pengfei Shi
- Serestina Viriri
- Bao-Liang Lu
- Wojciech Samek
Venues
- CoRR
- ICPR
- Multim. Tools Appl.
- INTERSPEECH
- CLEF (Working Notes)
- CVPR Workshops
- J. Electronic Imaging
- IJCNN
- Neural Comput. Appl.
- Pattern Recognit.
- ICIP
- Pattern Recognit. Lett.
- IET Biom.
- CIARP
- IEEE Access
- ICASSP
- Pattern Anal. Appl.
- Manag. Sci.
- Image Vis. Comput.
- IJCB
- IEEE Trans. Inf. Forensics Secur.
- ICCV Workshops
- WACV
- Neurocomputing
- SIU
- SIBGRAPI
- Comput. Hum. Behav.
- ICB
- Expert Syst. Appl.
- IWBF
- BIOSIG
- Symmetry
- FG
- CCBR
- EMNLP
- Sensors
- ASIST
- J. Vis. Commun. Image Represent.
- Proc. ACM Hum. Comput. Interact.
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.