FACIAL LANDMARKS
Experts
- Georgios Tzimiropoulos
- Jiankang Deng
- Ioannis A. Kakadiaris
- Stefanos Zafeiriou
- Mohamed Abdel-Mottaleb
- Christoph Busch
- Mohamed Daoudi
- Dakshina Ranjan Kisku
- Shishir K. Shah
- Vitomir Struc
- Veikko Surakka
- Gérard G. Medioni
- Dimitris N. Metaxas
- Peter Peer
- Hiroshi Kobayashi
- Shaun J. Canavan
- Tal Hassner
- Dong Seog Han
- Qingshan Liu
- Adrian Bulat
- John See
- Honggang Qi
- Luis Baumela
- Ziga Emersic
- Zhichun Mu
- Rama Chellappa
- Phalguni Gupta
- Peter H. Tu
- Junliang Xing
- Jie Shen
- Rasmus R. Paulsen
- Zhen-Hua Feng
- Xi Li
- Kaihua Zhang
- Bo Li
- Vojtech Franc
- Julian Fiérrez
- Jun-Cheng Chen
- Shuicheng Yan
Venues
- CoRR
- FG
- ICIP
- IEEE Access
- ICPR
- Neurocomputing
- Multim. Tools Appl.
- ACM Multimedia
- ICCV Workshops
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- CVPR Workshops
- CVPR
- BMVC
- AAAI
- Sensors
- IEEE Trans. Image Process.
- ICME
- Int. J. Comput. Vis.
- J. Electronic Imaging
- Pattern Recognit. Lett.
- ICASSP
- Comput. Vis. Image Underst.
- ICCV
- Symmetry
- WACV
- FGR
- IJCNN
- EMBC
- ICB
- MVA
- Expert Syst. Appl.
- Neural Comput. Appl.
- Int. J. Biom.
- CISP-BMEI
- SMC
- Image Vis. Comput.
- Vis. Comput.
- ACM Trans. Multim. Comput. Commun. Appl.
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