FACE MATCHING
Experts
- Mayank Vatsa
- Richa Singh
- Christoph Busch
- Anil K. Jain
- Guodong Guo
- Jean-Luc Dugelay
- Stan Z. Li
- Christian Rathgeb
- Arun Ross
- Kiran B. Raja
- Debotosh Bhattacharjee
- Kevin W. Bowyer
- P. Jonathon Phillips
- Himanshu S. Bhatt
- Shiguang Shan
- Patrick J. Flynn
- Iacopo Masi
- Naser Damer
- Zhen Lei
- Ran He
- Mita Nasipuri
- Andreas Lanitis
- Gérard G. Medioni
- Christopher J. Taylor
- Sébastien Marcel
- Stefanos Zafeiriou
- Timothy F. Cootes
- Pavel Král
- Raghavendra Ramachandra
- Vitomir Struc
- Ulrich Scherhag
- Florian Kirchbuchner
- Ladislav Lenc
- Huy H. Nguyen
- Isao Echizen
- Samarth Bharadwaj
- Massimo Tistarelli
- Dong Yi
- Weihong Deng
Venues
- CoRR
- FG
- IEEE Trans. Inf. Forensics Secur.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICIP
- CVPR Workshops
- Pattern Recognit.
- ICPR
- CogSci
- BIOSIG
- IEEE Access
- IJCB
- BTAS
- Image Vis. Comput.
- ICB
- CVPR
- Pattern Recognit. Lett.
- Multim. Tools Appl.
- ICASSP
- NeuroImage
- ICCV
- IET Biom.
- FGR
- WACV
- Neurocomputing
- IWBF
- J. Cogn. Neurosci.
- SIU
- IEEE Trans. Image Process.
- INTERSPEECH
- Int. J. Pattern Recognit. Artif. Intell.
- RO-MAN
- BMVC
- IJCNN
- Expert Syst. Appl.
- ICME
- ICBA
- Sensors
- EUSIPCO
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