FACE ALIGNMENT
Experts
- Xiaoming Liu
- Stan Z. Li
- Shiguang Shan
- Daijin Kim
- Stefanos Zafeiriou
- Edwin R. Hancock
- Dimitris N. Metaxas
- William A. P. Smith
- Xiaoou Tang
- Jiankang Deng
- Bao-Liang Lu
- Arnaud Dapogny
- Lizhuang Ma
- Chen Change Loy
- Xilin Chen
- Haizhou Ai
- Zhiwen Shao
- Maja Pantic
- Shuicheng Yan
- Zhen Lei
- Mohammad H. Mahoor
- Georgios Tzimiropoulos
- Qiang Ji
- Kevin Bailly
- Hazim Kemal Ekenel
- Qingshan Liu
- Congcong Zhu
- Hyung-Soo Lee
- Jing Wu
- Hao Liu
- Christopher J. Taylor
- Jun Wan
- Yunhong Wang
- Junliang Xing
- Amin Jourabloo
- Renaud Séguier
- Weihong Deng
- Hengliang Zhu
- Xi Peng
Venues
- CoRR
- CVPR
- ICIP
- FG
- Pattern Recognit.
- ICCV
- BMVC
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICME
- IEEE Trans. Image Process.
- CVPR Workshops
- ICASSP
- Multim. Tools Appl.
- Image Vis. Comput.
- FGR
- IEEE Access
- IEEE Signal Process. Lett.
- AAAI
- Pattern Recognit. Lett.
- Neurocomputing
- ICB
- Comput. Vis. Image Underst.
- SMC
- CCBR
- Sensors
- Int. J. Comput. Vis.
- ICCV Workshops
- ACM Multimedia
- EUSIPCO
- Expert Syst. Appl.
- IEEE Trans. Inf. Forensics Secur.
- IET Biom.
- Pattern Anal. Appl.
- IJCNN
- WACV
- CIARP
- IET Comput. Vis.
- IJCB
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