FACE ALIGNMENT
Experts
- Xiaoming Liu
- Shiguang Shan
- Stan Z. Li
- Edwin R. Hancock
- Daijin Kim
- Stefanos Zafeiriou
- Dimitris N. Metaxas
- William A. P. Smith
- Jiankang Deng
- Xiaoou Tang
- Bao-Liang Lu
- Lizhuang Ma
- Chen Change Loy
- Arnaud Dapogny
- Xilin Chen
- Zhiwen Shao
- Zhen Lei
- Shuicheng Yan
- Haizhou Ai
- Maja Pantic
- Hazim Kemal Ekenel
- Mohammad H. Mahoor
- Qiang Ji
- Georgios Tzimiropoulos
- Kevin Bailly
- Qingshan Liu
- Weihong Deng
- Junliang Xing
- Renaud Séguier
- Amin Jourabloo
- Yunhong Wang
- Hyung-Soo Lee
- Hao Liu
- Christopher J. Taylor
- Jing Wu
- Jun Wan
- Congcong Zhu
- Rogério Schmidt Feris
- HongJiang Zhang
Venues
- CoRR
- CVPR
- ICIP
- FG
- Pattern Recognit.
- ICCV
- BMVC
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICME
- IEEE Trans. Image Process.
- CVPR Workshops
- FGR
- Image Vis. Comput.
- IEEE Access
- IEEE Signal Process. Lett.
- ICASSP
- Multim. Tools Appl.
- SMC
- Pattern Recognit. Lett.
- AAAI
- Neurocomputing
- Comput. Vis. Image Underst.
- ICB
- CCBR
- Sensors
- Int. J. Comput. Vis.
- ACM Multimedia
- EUSIPCO
- ICCV Workshops
- IEEE Trans. Inf. Forensics Secur.
- IET Biom.
- IJCNN
- CIARP
- Expert Syst. Appl.
- Comput. Graph. Forum
- ACM Trans. Multim. Comput. Commun. Appl.
- Pattern Anal. Appl.
- J. Vis. Commun. Image Represent.
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