DIAGNOSTIC EXPERT SYSTEMS
Experts
- Robert Milne
- Li Fei-Fei
- José M. F. Moura
- Dhruv Batra
- Zechen Li
- Seppo Torvinen
- Marcus Rohrbach
- Bharath Hariharan
- Justin Johnson
- Karl Fasching
- Christian Stary
- C. Lawrence Zitnick
- Ross B. Girshick
- Laurens van der Maaten
- Devi Parikh
- Satwik Kottur
- Anders Søgaard
- Ute Gappa
- Susanne P. Lajoie
- Khaled Shaalan
- Jan Treur
- Sameer Serhal
- Wolfgang Wohlgemuth
- S. P. Lapage
- Martin Hofmann
- Étienne Loiez
- John Delaney
- F. E. Slojkowski
- J. R. Hahn
- Szeyu Chan
- Jerome Tonetti
- Masahiro Takakura
- Alexander Feldman
- Anna Stein
- Tolga Kurtoglu
- Dominique Prévit
- Jean-Maxime Le Carpentier
- Stefan K. Bamberger
- Joseph A. Drallmeier
Venues
- CoRR
- J. Intell. Manuf.
- MIE
- IC
- IEA/AIE
- Softw. Pract. Exp.
- IEA/AIE (Vol. 1)
- ITC
- ITS
- JFPLC
- Expert Syst. J. Knowl. Eng.
- DEXA
- Scientometrics
- IEA/AIE (Vol. 2)
- SCAI
- TALN (Demonstrations)
- Artif. Intell. Eng. Des. Anal. Manuf.
- Artif. Intell. Medicine
- CVPR
- AMIA
- AI Mag.
- FJCC
- Actes d'IC
- Synth.
- CAIA
- RTS
- ICAD
- ECAI
- RFC
- HEALTHINF (2)
- IHM
- Rev. d'Intelligence Artif.
- Russ. Digit. Libr. J.
- JFSMA
- CogSci
- Bell Syst. Tech. J.
- Sensors
- Microprocess. Microsystems
- NAACL-HLT (Findings)
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