DIAGNOSTIC EXPERT SYSTEMS
Experts
- Laurens van der Maaten
- Bharath Hariharan
- Devi Parikh
- Ross B. Girshick
- Robert Milne
- Karl Fasching
- Marcus Rohrbach
- José M. F. Moura
- Dhruv Batra
- Li Fei-Fei
- Christian Stary
- C. Lawrence Zitnick
- Zechen Li
- Seppo Torvinen
- Justin Johnson
- Anders Søgaard
- Satwik Kottur
- W. R. Willcox
- M. N. Nilopets
- Piotr Augustyniak
- J. G. Athey
- Ahmed A. Rafea
- Anna Stein
- Juan E. Vargas
- Graham F. Forsyth
- Vanda Luengo
- Joan Colomer-Llinas
- Oleh V. Andriichuk
- Carine Webber
- Linda G. Means
- Alexandre Tessier
- Ivan Smilauer
- Dominique Prévit
- Hiroki Yamanaka
- Fernando Caldeira-Saraiva
- Dean Allemang
- Khaled Shaalan
- J. J. Hannan
- Natalie Rivadeneira
Venues
- CoRR
- J. Intell. Manuf.
- ITS
- MIE
- Softw. Pract. Exp.
- IEA/AIE (Vol. 1)
- IEA/AIE
- JFPLC
- IC
- ITC
- DEXA
- CAIA
- Artif. Intell. Eng. Des. Anal. Manuf.
- AI Mag.
- Comput. J.
- Microprocess. Microsystems
- NAACL-HLT (Findings)
- ICCA
- SCAI
- Synth.
- TALN (Demonstrations)
- IEEE Instrum. Meas. Mag.
- AI Commun.
- MetroAutomotive
- IntelliSys (1)
- CogSci
- Artif. Intell. Medicine
- Tech. Sci. Informatiques
- CVPR
- J. Am. Medical Informatics Assoc.
- Rev. d'Intelligence Artif.
- Bell Syst. Tech. J.
- Knowl. Based Syst.
- NAACL-HLT (1)
- FJCC
- IEEE Expert
- Sensors
- Egypt. Comput. Sci. J.
- IHM
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