DIAGNOSTIC EXPERT SYSTEMS
Experts
- Satwik Kottur
- Justin Johnson
- Anders Søgaard
- C. Lawrence Zitnick
- Zechen Li
- Seppo Torvinen
- Li Fei-Fei
- Christian Stary
- Karl Fasching
- Marcus Rohrbach
- Robert Milne
- José M. F. Moura
- Dhruv Batra
- Devi Parikh
- Ross B. Girshick
- Bharath Hariharan
- Laurens van der Maaten
- Hiroki Yamanaka
- Szeyu Chan
- Fradj Ben Lamine
- Natalie Rivadeneira
- Huguette Lioté
- Xavier Gansel
- Roberto Setola
- Valy Fontil
- Silvano Mussi
- Vittorio Rossetti
- Charles E. Solbrig
- Katherine E. Lewis
- Kosuke Ishii
- Olivier Hû
- Elaine C. Khoong
- Luca Faramondi
- F. E. Slojkowski
- W. R. Willcox
- Lucile Vadcard
- Kurt Godden
- Steven L. Lytinen
- E. V. Volkova
Venues
- CoRR
- J. Intell. Manuf.
- Softw. Pract. Exp.
- IEA/AIE (Vol. 1)
- MIE
- ITC
- ITS
- IEA/AIE
- JFPLC
- IC
- ICAD
- AI Commun.
- AMIA
- IEEE Instrum. Meas. Mag.
- TALN (Demonstrations)
- Sensors
- Synth.
- Rev. d'Intelligence Artif.
- MetroAutomotive
- CVPR
- Artif. Intell. Medicine
- Tech. Sci. Informatiques
- CogSci
- J. Am. Medical Informatics Assoc.
- Bell Syst. Tech. J.
- IntelliSys (1)
- Microprocess. Microsystems
- AI Mag.
- Comput. J.
- CAIA
- SCAI
- HEALTHINF (2)
- Scientometrics
- IEA/AIE (Vol. 2)
- RTS
- Expert Syst. J. Knowl. Eng.
- KI
- RFC
- Actes d'IC
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