DIAGNOSTIC EXPERT SYSTEMS
Experts
- Laurens van der Maaten
- Bharath Hariharan
- Ross B. Girshick
- Devi Parikh
- Dhruv Batra
- José M. F. Moura
- Karl Fasching
- Marcus Rohrbach
- Robert Milne
- Christian Stary
- Li Fei-Fei
- Seppo Torvinen
- Zechen Li
- C. Lawrence Zitnick
- Anders Søgaard
- Justin Johnson
- Satwik Kottur
- Valy Fontil
- Peter Politakis
- Orlando Contreras
- Stefan Schewe
- Fernando Caldeira-Saraiva
- Dean Allemang
- Khaled Shaalan
- J. J. Hannan
- Alexandre Tessier
- Lukas D. Kuhn
- Szeyu Chan
- Hiroki Yamanaka
- Joan Colomer-Llinas
- Natalie Rivadeneira
- Carine Webber
- Linda G. Means
- Juan E. Vargas
- Graham F. Forsyth
- Vanda Luengo
- Ivan Smilauer
- Ahmed A. Rafea
- Dominique Prévit
Venues
- CoRR
- J. Intell. Manuf.
- ITC
- JFPLC
- IC
- IEA/AIE
- ITS
- IEA/AIE (Vol. 1)
- Softw. Pract. Exp.
- MIE
- DEXA
- Artif. Intell. Eng. Des. Anal. Manuf.
- ECAI
- Russ. Digit. Libr. J.
- Microprocess. Microsystems
- ICCA
- Scientometrics
- HEALTHINF (2)
- IEA/AIE (Vol. 2)
- NAACL-HLT (Findings)
- RFC
- RTS
- Expert Syst. J. Knowl. Eng.
- KI
- Expert Syst. Appl.
- Actes d'IC
- JFSMA
- Egypt. Comput. Sci. J.
- ICLS (1)
- IHM
- ICAD
- AMIA
- Sensors
- IEEE Expert
- FJCC
- NAACL-HLT (1)
- Knowl. Based Syst.
- Rev. d'Intelligence Artif.
- Bell Syst. Tech. J.
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