CONFOCAL LASER SCANNING MICROSCOPY
Experts
- Reinhard Windoffer
- Peter Bajcsy
- Til Aach
- Rodney A. Brooks
- Gerlind Herberich
- Rudolf E. Leube
- Haiqiang Fu
- Aaron M. Jones
- Francisco José Madrid-Cuevas
- Cristina Cirtoaje
- Lei Xing
- Vicente Grau
- Michiharu Osada
- Aydogan Ozcan
- Xing Peng
- Takashi Otuka
- Yue Huang
- Yuichi Hoshino
- Olivier D. Faugeras
- Luis Díaz-Más
- Rony Touma
- Kunyang Li
- Vida Dujmovic
- Mariusz Bikowski
- Shien-Fong Lin
- Hanyi Yu
- Jianjun Zhu
- Bo Zhang
- Delong Zhang
- Duke Pauli
- Jia Zhang
- K. Kosak
- Bart J. F. Keijser
- Andreas Friedrich
- Spela Korent Urek
- Kevin Kelly
- Bia Kim
- Habib Talhami
- Laurence Leherte
Venues
- Sensors
- IEEE Trans. Medical Imaging
- CoRR
- EMBC
- IJCAI
- IEEE Access
- ISBI
- SIAM J. Imaging Sci.
- BMC Bioinform.
- J. Medical Imaging Health Informatics
- SIAM J. Appl. Dyn. Syst.
- Microprocess. Microprogramming
- IAS
- IEEE Trans. Biomed. Eng.
- EANN/AIAI (2)
- ICIP (1)
- IGARSS
- IEEE Trans. Pattern Anal. Mach. Intell.
- CARS
- ITSC
- SoftwareX
- Color Imaging Conference
- AMAI@MICCAI
- J. Adv. Comput. Intell. Intell. Informatics
- J. Comput. Chem.
- ICIAP Workshops
- Astron. Comput.
- Comput. Vis. Image Underst.
- Medical Image Anal.
- IEEE Trans. Image Process.
- Remote. Sens.
- J. Artif. Intell. Res.
- SIBGRAPI
- J. Digit. Imaging
- Image Vis. Comput.
- ICNN
- Comput. Graph. Forum
- J. Comput. Phys.
- CBMS
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend