COMPONENT LABELING
Experts
- Wei Lu
- Susanne E. Hambrusch
- Chin-Chen Chang
- Alina N. Moga
- Dan Schonfeld
- Moncef Gabbouj
- Tetsuo Asano
- Hongchi Shi
- Robert Cypher
- Yuileong Yeung
- Lidija Comic
- Péter Balázs
- Debranjan Sarkar
- Kuo-Liang Chung
- Jorge L. C. Sanz
- L. Snyder
- Yingjie Xue
- Kuo-Chin Fan
- Gerhard X. Ritter
- Kálmán Palágyi
- Eugene I. Ageenko
- Bin Yao
- Paola Magillo
- Lifeng He
- Yuyan Chao
- Hae Yong Kim
- Pasi Fränti
- Bingwen Feng
- Gabriella Sanniti di Baja
- Susan Wegner
- Chung-Chuan Wang
- Joseph F. JáJá
- Chin-Chuan Han
- Maria Jose Jimenez
- Majid Banaeyan
- Gábor Németh
- Xin He
- Peer Stelldinger
- Adnan A. Y. Mustafa
Venues
- CoRR
- Systems and Computers in Japan
- Pattern Recognit.
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Image Process.
- J. Parallel Distributed Comput.
- Int. J. Pattern Recognit. Artif. Intell.
- ICIP
- ICDAR
- J. Math. Imaging Vis.
- ICASSP
- J. Vis. Commun. Image Represent.
- MVA
- CVGIP Graph. Model. Image Process.
- DGCI
- Image Vis. Comput.
- Softw. Pract. Exp.
- IWDW
- ICPR
- Comput. Graph.
- IWCIA
- ICPR (2)
- Parallel Comput.
- CAIP
- J. Supercomput.
- IPDPS
- IEEE Trans. Computers
- Comput. Vis. Graph. Image Process.
- ICPR (3)
- ICPP (3)
- ICIAP (2)
- ICSIPA
- Signal Process.
- Comput. Aided Des.
- Inf. Process. Lett.
- Multim. Tools Appl.
- Vis. Comput.
- Comput. Vis. Image Underst.
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