COMPONENT LABELING
Experts
- Wei Lu
- Susanne E. Hambrusch
- Chin-Chen Chang
- Alina N. Moga
- Yuileong Yeung
- Lidija Comic
- Hongchi Shi
- Robert Cypher
- Tetsuo Asano
- Dan Schonfeld
- Moncef Gabbouj
- L. Snyder
- Péter Balázs
- Debranjan Sarkar
- Kuo-Liang Chung
- Jorge L. C. Sanz
- Eugene I. Ageenko
- Bin Yao
- Gerhard X. Ritter
- Kálmán Palágyi
- Yingjie Xue
- Kuo-Chin Fan
- Gabriella Sanniti di Baja
- Pasi Fränti
- Bingwen Feng
- Lifeng He
- Paola Magillo
- Yuyan Chao
- Hae Yong Kim
- Sigrún Andradóttir
- Roger D. Hersch
- Hiroshi Umeo
- Nagarajan Ranganathan
- Kenneth G. Ricks
- Srinivas R. Kadaba
- Luca Ghilardi
- Massimo Maresca
- Yansheng Wu
- Gloria Bordogna
Venues
- CoRR
- Systems and Computers in Japan
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit. Lett.
- IEEE Trans. Image Process.
- J. Parallel Distributed Comput.
- Int. J. Pattern Recognit. Artif. Intell.
- ICIP
- ICDAR
- J. Math. Imaging Vis.
- ICASSP
- J. Vis. Commun. Image Represent.
- MVA
- CVGIP Graph. Model. Image Process.
- DGCI
- Image Vis. Comput.
- ICPR
- Softw. Pract. Exp.
- IWDW
- Parallel Comput.
- ICPR (2)
- Comput. Graph.
- IWCIA
- J. Supercomput.
- CAIP
- Comput. Vis. Graph. Image Process.
- IPDPS
- IEEE Trans. Computers
- ICPR (3)
- ICPP (3)
- ISVC (2)
- Comput. Aided Des.
- Signal Process.
- Multim. Tools Appl.
- Inf. Process. Lett.
- ICSIPA
- ICIAP (2)
- Electronic Imaging: Nonlinear Image Processing
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