COMPONENT LABELING
Experts
- Wei Lu
- Susanne E. Hambrusch
- Alina N. Moga
- Chin-Chen Chang
- L. Snyder
- Dan Schonfeld
- Moncef Gabbouj
- Péter Balázs
- Kuo-Liang Chung
- Tetsuo Asano
- Hongchi Shi
- Lidija Comic
- Yuileong Yeung
- Robert Cypher
- Jorge L. C. Sanz
- Debranjan Sarkar
- Gabriella Sanniti di Baja
- Yuyan Chao
- Kálmán Palágyi
- Lifeng He
- Bin Yao
- Bingwen Feng
- Pasi Fränti
- Yingjie Xue
- Paola Magillo
- Hae Yong Kim
- Kuo-Chin Fan
- Gerhard X. Ritter
- Eugene I. Ageenko
- Songpol Ongwattanakul
- Jinn-ke Jan
- Rocío González-Díaz
- Ullrich Köthe
- Chun-Jen Chen
- Gábor Németh
- Amir Afif
- Simone Milesi
- Kenneth G. Ricks
- Peer Stelldinger
Venues
- CoRR
- Pattern Recognit.
- Systems and Computers in Japan
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Image Process.
- J. Parallel Distributed Comput.
- Int. J. Pattern Recognit. Artif. Intell.
- ICDAR
- J. Vis. Commun. Image Represent.
- ICIP
- J. Math. Imaging Vis.
- ICASSP
- MVA
- DGCI
- Image Vis. Comput.
- CVGIP Graph. Model. Image Process.
- Softw. Pract. Exp.
- ICPP (3)
- J. Supercomput.
- IPDPS
- ICPR (3)
- CAIP
- ICPR
- ICPR (2)
- IEEE Trans. Computers
- IWCIA
- Parallel Comput.
- IWDW
- Comput. Vis. Graph. Image Process.
- Comput. Graph.
- PPOPP
- Multim. Tools Appl.
- ICCV Workshops
- SIBGRAPI
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- ISCAS (3)
- Inf. Process. Lett.
- IEEE Trans. Syst. Man Cybern.
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend