COMPONENT LABELING
Experts
- Wei Lu
- Chin-Chen Chang
- Alina N. Moga
- Susanne E. Hambrusch
- Dan Schonfeld
- Jorge L. C. Sanz
- Debranjan Sarkar
- Yuileong Yeung
- Robert Cypher
- Hongchi Shi
- Lidija Comic
- Kuo-Liang Chung
- Tetsuo Asano
- Péter Balázs
- Moncef Gabbouj
- L. Snyder
- Gerhard X. Ritter
- Eugene I. Ageenko
- Kuo-Chin Fan
- Hae Yong Kim
- Yingjie Xue
- Paola Magillo
- Pasi Fränti
- Bingwen Feng
- Bin Yao
- Lifeng He
- Yuyan Chao
- Kálmán Palágyi
- Gabriella Sanniti di Baja
- Rangasami L. Kashyap
- Susan Wegner
- David A. Bader
- Srinivas R. Kadaba
- Luca Ghilardi
- Junliang Zhang
- Majid Banaeyan
- Riccardo Poli
- Nikos P. Chrisochoides
- John Goutsias
Venues
- CoRR
- Systems and Computers in Japan
- Pattern Recognit.
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Image Process.
- J. Parallel Distributed Comput.
- Int. J. Pattern Recognit. Artif. Intell.
- ICDAR
- ICASSP
- ICIP
- J. Vis. Commun. Image Represent.
- J. Math. Imaging Vis.
- CVGIP Graph. Model. Image Process.
- MVA
- DGCI
- Image Vis. Comput.
- IWCIA
- Parallel Comput.
- IWDW
- Comput. Vis. Graph. Image Process.
- Comput. Graph.
- J. Supercomput.
- Softw. Pract. Exp.
- ICPP (3)
- ICPR
- ICPR (2)
- CAIP
- IEEE Trans. Computers
- IPDPS
- ICPR (3)
- Vis. Comput.
- IET Image Process.
- Electronic Imaging: Nonlinear Image Processing
- ISVC (2)
- Visual Information Processing
- SPDP
- ICPR (1)
- IEEE Trans. Inf. Theory
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