COMPONENT LABELING
Experts
- Wei Lu
- Alina N. Moga
- Chin-Chen Chang
- Susanne E. Hambrusch
- Dan Schonfeld
- Tetsuo Asano
- Péter Balázs
- Moncef Gabbouj
- Lidija Comic
- Kuo-Liang Chung
- Yuileong Yeung
- Debranjan Sarkar
- Hongchi Shi
- L. Snyder
- Robert Cypher
- Jorge L. C. Sanz
- Bin Yao
- Hae Yong Kim
- Eugene I. Ageenko
- Kálmán Palágyi
- Lifeng He
- Yingjie Xue
- Yuyan Chao
- Bingwen Feng
- Kuo-Chin Fan
- Gabriella Sanniti di Baja
- Gerhard X. Ritter
- Paola Magillo
- Pasi Fränti
- Pedro Real
- Adnan A. Y. Mustafa
- Anan Yaagoub
- Phaisit Chewputtanagul
- Liping Yang
- Joseph F. JáJá
- Péter Kardos
- David A. Bader
- Pierpaolo Baglietto
- Saul B. Gelfand
Venues
- CoRR
- Pattern Recognit.
- Systems and Computers in Japan
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit. Lett.
- IEEE Trans. Image Process.
- J. Parallel Distributed Comput.
- ICIP
- J. Vis. Commun. Image Represent.
- Int. J. Pattern Recognit. Artif. Intell.
- ICASSP
- ICDAR
- J. Math. Imaging Vis.
- MVA
- Image Vis. Comput.
- DGCI
- CVGIP Graph. Model. Image Process.
- Softw. Pract. Exp.
- ICPR
- IWCIA
- IWDW
- IPDPS
- J. Supercomput.
- Parallel Comput.
- ICPP (3)
- Comput. Graph.
- ICPR (3)
- CAIP
- Comput. Vis. Graph. Image Process.
- ICPR (2)
- IEEE Trans. Computers
- CTIC
- ICSIPA
- Signal Process.
- IEEE Trans. Syst. Man Cybern.
- Comput. Vis. Image Underst.
- ICPP
- Electronic Imaging: Nonlinear Image Processing
- SPDP
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