CLUSTER VALIDITY INDICES
Experts
- James C. Bezdek
- Katsuhiro Honda
- Hidetomo Ichihashi
- Akira Notsu
- Yasunori Endo
- James Bailey
- Yuchi Kanzawa
- Christopher Leckie
- Jeffrey Chan
- Yang Lei
- Xuan Vinh Nguyen
- Lawrence O. Hall
- Simone Romano
- Sanghamitra Bandyopadhyay
- Ahmed Ben Said
- Marimuthu Palaniswami
- Timothy C. Havens
- Sriparna Saha
- Sebti Foufou
- Leonardo Enzo Brito da Silva
- Masud Moshtaghi
- Yoshiyuki Komazaki
- Dante Mújica-Vargas
- Tina Geweniger
- Yukihiro Hamasuna
- Kaile Zhou
- Niklas Melton
- Pradipta Maji
- Punit Rathore
- Shanlin Yang
- Mingliang Ding
- Qi Li
- Aybüke Öztürk
- Francisco J. Gallegos Funes
- Thomas Villmann
- Sadaaki Miyamoto
- Jérôme Darmont
- Shihong Yue
- Mahnhoon Lee
Venues
- FUZZ-IEEE
- CoRR
- Expert Syst. Appl.
- Appl. Soft Comput.
- Fuzzy Sets Syst.
- Pattern Recognit.
- IEEE Access
- Soft Comput.
- MDAI
- Inf. Sci.
- Int. J. Fuzzy Syst.
- IEEE Trans. Fuzzy Syst.
- J. Intell. Fuzzy Syst.
- SCIS&ISIS
- HIS
- IFSA-SCIS
- Knowl. Based Syst.
- Pattern Recognit. Lett.
- IEA/AIE
- WSC
- BRACIS
- Res. Comput. Sci.
- Int. J. Intell. Syst.
- WSOM
- CIDM
- ReTIS
- FSKD (3)
- ICMLC
- ICSET
- ISNN (2)
- ESANN
- ICNC-FSKD
- Image Processing: Machine Vision Applications
- ICTC
- WCNC
- SMC
- J. Comput. Inf. Sci. Eng.
- EAIS
- IEEE Trans. Neural Networks Learn. Syst.
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