BOOSTED CLASSIFIERS
Experts
- Xilin Chen
- Chunhua Shen
- Shiguang Shan
- Nuno Vasconcelos
- Rodrigo Verschae
- Peng Wang
- Stan Z. Li
- Junjie Yan
- Zhaowei Cai
- Javier Ruiz-del-Solar
- Wen Gao
- Jinwoo Shin
- Jian Zhang
- Zhen Lei
- Gang Hua
- Shengye Yan
- Jinqiao Wang
- Jiri Matas
- Dacheng Tao
- Haoyu Ren
- Wankou Yang
- Modesto Castrillón Santana
- James M. Rehg
- Sakrapee Paisitkriangkrai
- Ze-Nian Li
- Wei Li
- Anastasios Tefas
- Richard Bowden
- Wanli Ouyang
- Robert E. Schapire
- Jan Sochman
- Peihua Li
- Terrance E. Boult
- Shuai Yi
- Liang Lin
- Blaise Hanczar
- Hidefumi Kobatake
- Shuo Yang
- Akinobu Shimizu
Venues
- CoRR
- CVPR
- ICIP
- Pattern Recognit. Lett.
- Multim. Tools Appl.
- ICASSP
- Sensors
- ICPR
- IEEE Access
- ICME
- FG
- AAAI
- CVPR Workshops
- Pattern Recognit.
- SMC
- WACV
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- IJCNN
- Knowl. Based Syst.
- Int. J. Pattern Recognit. Artif. Intell.
- IPCV
- ICML
- BMVC
- Neurocomputing
- IEEE Signal Process. Lett.
- Image Vis. Comput.
- AVBPA
- AIPR
- IEEE Trans. Geosci. Remote. Sens.
- EuroGP
- Signal Image Video Process.
- AVSS
- ICPRAM
- SITIS
- SIU
- Wirel. Pers. Commun.
- FGR
- CIARP
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