BOOSTED CLASSIFIERS
Experts
- Xilin Chen
- Shiguang Shan
- Chunhua Shen
- Nuno Vasconcelos
- Rodrigo Verschae
- Peng Wang
- Zhaowei Cai
- Junjie Yan
- Stan Z. Li
- Javier Ruiz-del-Solar
- Jinwoo Shin
- Wen Gao
- Zhen Lei
- Jian Zhang
- Jinqiao Wang
- Gang Hua
- Shengye Yan
- Jiri Matas
- Haoyu Ren
- Dacheng Tao
- Wankou Yang
- James M. Rehg
- Modesto Castrillón Santana
- Sakrapee Paisitkriangkrai
- Peihua Li
- Jan Sochman
- Robert E. Schapire
- Wanli Ouyang
- Anastasios Tefas
- Richard Bowden
- Wei Li
- Ze-Nian Li
- Hidefumi Kobatake
- Blaise Hanczar
- Liang Lin
- Shuai Yi
- Terrance E. Boult
- Josef Kittler
- Tat-Jen Cham
Venues
- CoRR
- CVPR
- ICIP
- Pattern Recognit. Lett.
- Multim. Tools Appl.
- Sensors
- ICASSP
- ICPR
- IEEE Access
- ICME
- FG
- AAAI
- Pattern Recognit.
- CVPR Workshops
- SMC
- WACV
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- IJCNN
- Knowl. Based Syst.
- BMVC
- IPCV
- ICML
- Int. J. Pattern Recognit. Artif. Intell.
- Image Vis. Comput.
- IEEE Signal Process. Lett.
- Neurocomputing
- AVBPA
- EuroGP
- IEEE Trans. Geosci. Remote. Sens.
- AIPR
- AVSS
- Signal Image Video Process.
- SIU
- SITIS
- ICPRAM
- Wirel. Pers. Commun.
- RIVF
- IGARSS
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