BOOSTED CLASSIFIERS
Experts
- Xilin Chen
- Shiguang Shan
- Chunhua Shen
- Nuno Vasconcelos
- Rodrigo Verschae
- Zhaowei Cai
- Peng Wang
- Javier Ruiz-del-Solar
- Stan Z. Li
- Junjie Yan
- James M. Rehg
- Modesto Castrillón Santana
- Jinqiao Wang
- Zhen Lei
- Dacheng Tao
- Wankou Yang
- Wen Gao
- Shengye Yan
- Jian Zhang
- Haoyu Ren
- Jiri Matas
- Gang Hua
- Jinwoo Shin
- Sakrapee Paisitkriangkrai
- Terrance E. Boult
- Vishal M. Patel
- Josef Kittler
- Johel Mitéran
- Ze-Nian Li
- Hongwei Qin
- Haijing Wang
- Dong Liang
- Hidefumi Kobatake
- Wei Li
- Jianxin Wu
- Philip H. S. Torr
- Przemyslaw Klesk
- Kyoung Mu Lee
- Akinobu Shimizu
Venues
- CoRR
- CVPR
- ICIP
- Pattern Recognit. Lett.
- Multim. Tools Appl.
- ICASSP
- Sensors
- IEEE Access
- ICPR
- ICME
- FG
- CVPR Workshops
- AAAI
- Pattern Recognit.
- SMC
- WACV
- ICCV
- IJCNN
- IEEE Trans. Pattern Anal. Mach. Intell.
- Image Vis. Comput.
- IEEE Signal Process. Lett.
- Neurocomputing
- Knowl. Based Syst.
- Int. J. Pattern Recognit. Artif. Intell.
- BMVC
- IPCV
- ICML
- AVBPA
- AVSS
- Wirel. Pers. Commun.
- AIPR
- EuroGP
- SIU
- IEEE Trans. Geosci. Remote. Sens.
- SITIS
- ICPRAM
- Signal Image Video Process.
- RIVF
- EMBC
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