BOOSTED CLASSIFIERS
Experts
- Xilin Chen
- Chunhua Shen
- Shiguang Shan
- Nuno Vasconcelos
- Rodrigo Verschae
- Javier Ruiz-del-Solar
- Zhaowei Cai
- Peng Wang
- Stan Z. Li
- Junjie Yan
- Jiri Matas
- Haoyu Ren
- Zhen Lei
- Gang Hua
- Jinqiao Wang
- Sakrapee Paisitkriangkrai
- Shengye Yan
- Modesto Castrillón Santana
- Dacheng Tao
- James M. Rehg
- Jinwoo Shin
- Wankou Yang
- Jian Zhang
- Wen Gao
- Hongwei Qin
- Rama Chellappa
- Liang Lin
- Jean-Philippe Thiran
- Zhen Xiang
- Tianwen Zhang
- Anastasios Tefas
- Shuo Yang
- Tat-Jen Cham
- Josef Kittler
- Haijing Wang
- Chen Change Loy
- Vishal M. Patel
- Dong Liang
- Ze-Nian Li
Venues
- CoRR
- CVPR
- ICIP
- Pattern Recognit. Lett.
- Multim. Tools Appl.
- ICASSP
- Sensors
- ICPR
- IEEE Access
- ICME
- FG
- Pattern Recognit.
- AAAI
- CVPR Workshops
- WACV
- SMC
- ICCV
- IJCNN
- IEEE Trans. Pattern Anal. Mach. Intell.
- Int. J. Pattern Recognit. Artif. Intell.
- Knowl. Based Syst.
- Neurocomputing
- ICML
- AVBPA
- BMVC
- Image Vis. Comput.
- IPCV
- IEEE Signal Process. Lett.
- AIPR
- AVSS
- Wirel. Pers. Commun.
- SIU
- Signal Image Video Process.
- EuroGP
- SITIS
- ICPRAM
- IEEE Trans. Geosci. Remote. Sens.
- Int. J. Comput. Vis.
- FGR
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