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Yi Jin
ORCID
Publication Activity (10 Years)
Years Active: 2017-2024
Publications (10 Years): 5
Top Topics
Evaluation Methods
Credit Risk
Product Information
Electronic Circuits
Top Venues
ICSRS
IEEE Trans. Ind. Electron.
Symmetry
Microelectron. Reliab.
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Publications
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Yi Jin
,
Qingyuan Zhang
Cascading Failure Modeling for Circuit Systems Considering Continuous Degradation and Random Shocks Using an Impedance Network.
Symmetry
16 (4) (2024)
Tianpei Zu
,
Ze Wang
,
Yi Jin
,
Rui Kang
Belief Reliability Evaluation Method Based on Similar Product Information.
ICSRS
(2023)
Yi Jin
,
Qingyuan Zhang
,
Yunxia Chen
,
Zhendan Lu
,
Tianpei Zu
Cascading failures modeling of electronic circuits with degradation using impedance network.
Reliab. Eng. Syst. Saf.
233 (2023)
Yi Jin
,
Yunxia Chen
,
Zhendan Lu
,
Qingyuan Zhang
,
Rui Kang
Cascading Failure Modeling for Circuit Systems Using Impedance Networks: A Current-Flow Redistribution Approach.
IEEE Trans. Ind. Electron.
68 (1) (2021)
Yunxia Chen
,
Yi Jin
,
Rui Kang
Coupling damage and reliability modeling for creep and fatigue of solder joint.
Microelectron. Reliab.
75 (2017)