Y. T. Yeow

Publication Activity (10 Years)

Years Active: 2001-2001
Publications (10 Years): 0

Publications

C. T. Hsu, M. M. Lau, Y. T. Yeow
Analysis of the gate capacitance measurement technique and its application for the evaluation of hot-carrier degradation in submicrometer MOSFETs. Microelectron. Reliab. 41 (2) (2001)