William R. Mann

Publication Activity (10 Years)

Years Active: 1989-2008
Publications (10 Years): 0

Publications

William R. Mann
Wafer Test Methods to Improve Semiconductor Die Reliability. IEEE Des. Test Comput. 25 (6) (2008)
William R. Mann, Frederick L. Taber, Philip W. Seitzer, Jerry J. Broz
The Leading Edge of Production Wafer Probe Test Technology. ITC (2004)
William R. Mann
R96MFX Test Strategy. ITC (1989)