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V. C. Ngwan
Publication Activity (10 Years)
Years Active: 2016-2016
Publications (10 Years): 1
Top Topics
Data Processing
Key Findings
Top Venues
Microelectron. Reliab.
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Publications
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Giacomo Barletta
,
V. C. Ngwan
Study of gate leakage mechanism in advanced charge-coupled MOSFET (CC-MOSFET) technology.
Microelectron. Reliab.
57 (2016)