Shin Hong

Publication Activity (10 Years)

Years Active: 2009-2024
Publications (10 Years): 19

Top Topics

Mutation Operator

Test Generation

Top Venues

Softw. Test. Verification Reliab.

Publications

Jeewoong Kim, Shin Hong
BugOss: A benchmark of real-world regression bugs for empirical investigation of regression fuzzing techniques. J. Syst. Softw. 216 (2024)
Antonia Bertolino, Shin Hong, Aditya P. Mathur
Introduction to the special issue on automation of software test and test code quality. J. Softw. Evol. Process. 35 (4) (2023)
Jeewoong Kim, Shin Hong
Poster: BugOss: A Regression Bug Benchmark for Empirical Study of Regression Fuzzing Techniques. ICST (2023)
Juyeon Yoon, Seungjoon Chung, Kihyuck Shin, Jinhan Kim, Shin Hong, Shin Yoo
Repairing Fragile GUI Test Cases Using Word and Layout Embedding. ICST (2022)
Yunho Kim, Shin Hong
Learning-based mutant reduction using fine-grained mutation operators. Softw. Test. Verification Reliab. 32 (7) (2022)
Jinhan Kim, Juyoung Jeon, Shin Hong, Shin Yoo
Predictive Mutation Analysis via the Natural Language Channel in Source Code. ACM Trans. Softw. Eng. Methodol. 31 (4) (2022)
Yunho Kim, Shin Hong
Learning-based Mutant Reduction Using Fine-grained Mutation Operators. ICST (2022)
Jeewoong Kim, Shin Hong
Inferring Fine-grained Traceability Links between Javadoc Comment and JUnit Test Code. ICSME (2022)
Jinhan Kim, Juyoung Jeon, Shin Hong, Shin Yoo
Predictive Mutation Analysis via Natural Language Channel in Source Code. CoRR (2021)
Robert Sebastian Herlim, Shin Hong, Yunho Kim, Moonzoo Kim
Empirical Study of Effectiveness of EvoSuite on the SBST 2020 Tool Competition Benchmark. SSBSE (2021)
Juyoung Jeon, Shin Hong
Improving Mutation-Based Fault Localization with Plausible-code Generating Mutation Operators. ASE (2021)
Yunho Kim, Shin Hong
DEMINER: test generation for high test coverage through mutant exploration. Softw. Test. Verification Reliab. 31 (1-2) (2021)
Hanyoung Yoo, Jingun Hong, Lucas Bader, Dongwon Hwang, Shin Hong
Improving Configurability of Unit-level Continuous Fuzzing: An Industrial Case Study with SAP HANA. ASE (2021)
Juyoung Jeon, Shin Hong
Threats to validity in experimenting mutation-based fault localization. ICSE (NIER) (2020)
Shin Hong
Using SMT Solver and Logic Puzzles for Teaching Computational Logics in Discrete Mathematics Class. SIGCSE (2020)
Yunho Kim, Shin Hong, Moonzoo Kim
Target-driven compositional concolic testing with function summary refinement for effective bug detection. ESEC/SIGSOFT FSE (2019)
Seongmin Lee, Shin Hong, Jungbae Yi, Taeksu Kim, Chul-Joo Kim, Shin Yoo
Classifying False Positive Static Checker Alarms in Continuous Integration Using Convolutional Neural Networks. ICST (2019)
Yunho Kim, Shin Hong, Bongseok Ko, Duy Loc Phan, Moonzoo Kim
Invasive Software Testing: Mutating Target Programs to Diversify Test Exploration for High Test Coverage. ICST (2018)
Shin Hong, Taehoon Kwak, Byeongcheol Lee, Yiru Jeon, Bongseok Ko, Yunho Kim, Moonzoo Kim
MUSEUM: Debugging real-world multilingual programs using mutation analysis. Inf. Softw. Technol. 82 (2017)
Shin Hong, Moonzoo Kim
A survey of race bug detection techniques for multithreaded programmes. Softw. Test. Verification Reliab. 25 (3) (2015)
Shin Hong, Byeongcheol Lee, Taehoon Kwak, Yiru Jeon, Bongsuk Ko, Yunho Kim, Moonzoo Kim
Mutation-Based Fault Localization for Real-World Multilingual Programs (T). ASE (2015)
Shin Hong, Matt Staats, Jaemin Ahn, Moonzoo Kim, Gregg Rothermel
Are concurrency coverage metrics effective for testing: a comprehensive empirical investigation. Softw. Test. Verification Reliab. 25 (4) (2015)
Yongbae Park, Shin Hong, Moonzoo Kim, Dongju Lee, Junhee Cho
Systematic Testing of Reactive Software with Non-Deterministic Events: A Case Study on LG Electric Oven. ICSE (2) (2015)
Shin Hong, Yongbae Park, Moonzoo Kim
Detecting Concurrency Errors in Client-Side Java Script Web Applications. ICST (2014)
Shin Hong, Matt Staats, Jaemin Ahn, Moonzoo Kim, Gregg Rothermel
The Impact of Concurrent Coverage Metrics on Testing Effectiveness. ICST (2013)
Shin Hong, Moonzoo Kim
Effective pattern-driven concurrency bug detection for operating systems. J. Syst. Softw. 86 (2) (2013)
Shin Hong, Jaemin Ahn, Sangmin Park, Moonzoo Kim, Mary Jean Harrold
Testing concurrent programs to achieve high synchronization coverage. ISSTA (2012)
Matt Staats, Shin Hong, Moonzoo Kim, Gregg Rothermel
Understanding user understanding: determining correctness of generated program invariants. ISSTA (2012)
Moonzoo Kim, Shin Hong, Changki Hong, Taeho Kim
Model-based Kernel Testing for Concurrency Bugs through Counter Example Replay. Electron. Notes Theor. Comput. Sci. 253 (2) (2009)