Rajesh Saha

Publication Activity (10 Years)

Years Active: 2021-2024
Publications (10 Years): 12

Top Topics

Input Parameters

Sensitivity Analysis

Simulation Study

Top Venues

Microelectron. J.

Comput. Electr. Eng.

Int. J. Syst. Assur. Eng. Manag.

Publications

Rashi Chaudhary, Rajesh Saha, Menka Yadav
Analysis of thermal stability in underlap and overlap DMG FinFETs including self-heating effects. Microelectron. J. 146 (2024)
Shreyas Tiwari, Rajesh Saha
Sensitivity analysis of TMD TFET based photo-sensor for visible light detection: A simulation study. Microelectron. J. 143 (2024)
Prachuryya Subash Das, Deepjyoti Deb, Rupam Goswami, Santanu Sharma, Rajesh Saha
Fin core dimensionality and corner effect in dual core gate-all-around FinFET. Microelectron. J. 143 (2024)
Ravindra Kumar Maurya, Rajesh Saha, Brinda Bhowmick
Low to high-frequency noise behavior investigation of steeper sub-threshold swing NC-GeFinFET. Microelectron. J. 131 (2023)
Rashi Chaudhary, Rajesh Saha
Impact of self-heating on RF/analog and linearity parameters of DMG FinFETs in underlap and overlap configurations. Microelectron. J. 135 (2023)
Ravindra Kumar Maurya, Vivek Kumar, Rajesh Saha, Brinda Bhowmick
Effect of curie temperature on electrical parameters of NC-FinFET and digital switching application of NC-FinFET. Microelectron. J. 139 (2023)
Ayush Mangla, Rajesh Saha, Rupam Goswami
pocket variation. Microelectron. J. 129 (2022)
Deepjyoti Deb, Rupam Goswami, Ratul Kr. Baruah, Kavindra Kandpal, Rajesh Saha
double gate TFETs. Comput. Electr. Eng. 100 (2022)
Rajesh Saha, Rupam Goswami, Deepak Kumar Panda
Analysis on electrical parameters including temperature and interface trap charges in gate overlap Ge source step shape double gate TFET. Microelectron. J. 130 (2022)
Shreyas Tiwari, Rajesh Saha
Improved optical performance in near visible light detection photosensor based on TFET. Microelectron. J. 129 (2022)
Rajesh Saha
Simulation study on ferroelectric layer thickness dependence RF/Analog and linearity parameters in ferroelectric tunnel junction TFET. Microelectron. J. 113 (2021)
Rajesh Saha, Abdullahil Azeem, Kazi Wahadul Hasan, Syed Mithun Ali, Sanjoy Kumar Paul
Integrated economic design of quality control and maintenance management: Implications for managing manufacturing process. Int. J. Syst. Assur. Eng. Manag. 12 (2) (2021)