Omri Shacham

Publication Activity (10 Years)

Years Active: 2007-2013
Publications (10 Years): 0

Top Topics

Direct Binary Search

Halftoning Algorithm

Feature Vectors

Top Venues

IEEE Trans. Image Process.

Publications

Puneet Goyal, Madhur Gupta, Carl Staelin, Mani Fischer, Omri Shacham, Jan P. Allebach
Clustered-Dot Halftoning With Direct Binary Search. IEEE Trans. Image Process. 22 (2) (2013)
Jin-Young Kim, Yung-Yao Chen, Mani Fischer, Omri Shacham, Carl Staelin, Jan P. Allebach
Design of color screen sets for robustness to color plane misregistration. ICIP (2011)
Madhur Gupta, Puneet Goyal, Mani Fischer, Carl Staelin, Tamar Kashti, Omri Shacham, Jan P. Allebach
Stochastic clustered-dot screen design for improved smoothness. Color Imaging: Displaying, Processing, Hardcopy, and Applications (2011)
Puneet Goyal, Madhur Gupta, Carl Staelin, Mani Fischer, Omri Shacham, Tamar Kashti, Jan P. Allebach
Electro-photographic model based stochastic clustered-dot halftoning with direct binary search. ICIP (2011)
Puneet Goyal, Madhur Gupta, Carl Staelin, Mani Fischer, Omri Shacham, Jan P. Allebach
Cost function analysis for stochastic clustered-dot halftoning based on direct binary search. Color Imaging: Displaying, Processing, Hardcopy, and Applications (2011)
Jin-Young Kim, Yung-Yao Chen, Mani Fischer, Omri Shacham, Carl Staelin, Kurt R. Bengtson, Jan P. Allebach
Design of color screen tile vector sets. Color Imaging: Displaying, Processing, Hardcopy, and Applications (2011)
Puneet Goyal, Madhur Gupta, Doron Shaked, Carl Staelin, Mani Fischer, Omri Shacham, Rodolfo Jodra, Jan P. Allebach
Electro-photographic-model-based halftoning. Color Imaging: Displaying, Processing, Hardcopy, and Applications (2010)
Madhur Gupta, Carl Staelin, Mani Fischer, Omri Shacham, Rodolfo Jodra, Jan P. Allebach
Clustered-dot halftoning with direct binary search. Color Imaging: Displaying, Processing, Hardcopy, and Applications (2010)
Omri Shacham, Oren Haik, Yitzhak Yitzhaky
Blind restoration of atmospherically degraded images by automatic best step-edge detection. Pattern Recognit. Lett. 28 (15) (2007)