M. Wieberneit

Publication Activity (10 Years)

Years Active: 2008-2010
Publications (10 Years): 0

Publications

Claus Hartmann, M. Wieberneit
Investigation on BIST assisted failure analysis on digital integrated circuits. Microelectron. Reliab. 50 (9-11) (2010)
Claus Hartmann, M. Wieberneit
Investigation on marginal failure characteristics and related defects analysed by soft defect localization. Microelectron. Reliab. 49 (9-11) (2009)
Claus Hartmann, M. Wieberneit
Layout analysis as supporting tool for failure localization: Basic principles and case studies. Microelectron. Reliab. 48 (8-9) (2008)