Li-Chang Chao

Publication Activity (10 Years)

Years Active: 2008-2009
Publications (10 Years): 0

Publications

Li-Chang Chao, Lee-Ing Tong
Wafer defect pattern recognition by multi-class support vector machines by using a novel defect cluster index. Expert Syst. Appl. 36 (6) (2009)
Lee-Ing Tong, Li-Chang Chao
Novel yield model for integrated circuits with clustered defects. Expert Syst. Appl. 34 (4) (2008)