Javier Gago

Publication Activity (10 Years)

Years Active: 2003-2019
Publications (10 Years): 3

Top Topics

Stationary Camera

Uncalibrated Cameras

Top Venues

IEEE Trans. Ind. Electron.

Publications

Manuel Lopez-Palma, Javier Gago, Montserrat Corbalan, Josep Ramon Morros
Audience measurement using a top-view camera and oriented trajectories. IECON (2019)
Manuel Lopez-Palma, Javier Gago, Montserrat Corbalan, Josep Ramon Morros
Audience measurement using a top-view camera and oriented trajectories. CoRR (2019)
Manuel Lopez-Palma, Josep Ramon Morros, Javier Gago, Montserrat Corbalan
Oriented Trajectories as a Method for Audience Measurement. ISIE (2018)
Jan T. Bialasiewicz, David González, Josep Balcells, Javier Gago
Wavelet-Based Approach to Evaluation of Signal Integrity. IEEE Trans. Ind. Electron. 60 (10) (2013)
Ignacio Gil, Raúl Fernández-García, Javier Gago, Josep Balcells
Multiband EMI filter based on metamaterials. IEICE Electron. Express 7 (9) (2010)
Juan Mon, Javier Gago, David González, Josep Balcells, Raúl Fernández-García, Ignacio Gil, Paco Bogónez-Franco
Modulation technique to reduce EMI in power multiconverters. IEICE Electron. Express 6 (8) (2009)
Juan Mon, David González, Javier Gago, Josep Balcells
Combined application of interleaving and modulation techniques in multiconverter topology. ICECS (2008)
David González, Jan T. Bialasiewicz, Josep Balcells, Javier Gago
Wavelet-Based Performance Evaluation of Power Converters Operating With Modulated Switching Frequency. IEEE Trans. Ind. Electron. 55 (8) (2008)
Manuel Lamich, Josep Balcells, David González, Javier Gago
Three phase four wires shunt hybrid filter. ICECS (2008)
Salvador Alepuz, Sergio Busquets-Monge, Josep Bordonau, Javier Gago, David González, Josep Balcells
Interfacing Renewable Energy Sources to the Utility Grid Using a Three-Level Inverter. IEEE Trans. Ind. Electron. 53 (5) (2006)
David González, Javier Gago, Josep Balcells
New simplified method for the simulation of conducted EMI generated by switched power converters. IEEE Trans. Ind. Electron. 50 (6) (2003)