J. D. Boyd

Publication Activity (10 Years)

Years Active: 2010-2010
Publications (10 Years): 0

Publications

X. Dong, P. Zhu, Zhonghua Li, Jun Sun, J. D. Boyd
Electromigration-induced stress in a confined bamboo interconnect with randomly distributed grain sizes. Microelectron. Reliab. 50 (3) (2010)