Eugene R. Hnatek

Publication Activity (10 Years)

Years Active: 1976-1997
Publications (10 Years): 0

Publications

Donald Staab, Eugene R. Hnatek
Diagnosing IC Failures in a Fast Environment. IEEE Des. Test Comput. 14 (3) (1997)
Alex M. Ijaz, Eugene R. Hnatek
User Application of Statistical Process Monitor Techniques to ASIC Critical Parameters. ITC (1995)
Rick Boyle, Jack Donovan, Eugene R. Hnatek, Alex M. Ijaz
Application of Statistical Techniques to Critical System Parameters. ITC (1993)
Eugene R. Hnatek, Billy R. Livesay
Quality Issues of High Pin Count Fine Pitch VLSI Packages. ITC (1989)
Eugene R. Hnatek
IC Burn-In : The Changing Scene. ITC (1986)
Beau R. Wilson Jr., Eugene R. Hnatek
Problems Encountered in Developing VLSI Test Programs for COT (A Practical Outlook). ITC (1984)
Eugene R. Hnatek
Thoughts on VLSI Burn-in. ITC (1984)
Eugene R. Hnatek, Beau R. Wilson Jr.
An Evaluation of the 2816 EEPROM. ITC (1982)
Eugene R. Hnatek
Documentation for Testability : The Supplier's Responsibility to the User. ITC (1981)
Eugene R. Hnatek
Physics of computer memory devices: S Middelhoek, P K George and P Dekker. Academic Press (1976), 402 pp, £12.50. Microprocess. 1 (5) (1977)
Eugene R. Hnatek
Microprocessor-digital converter applications. Microprocess. 1 (4) (1977)
Eugene R. Hnatek
Microprocessor device reliability. Microprocess. 1 (5) (1977)
Eugene R. Hnatek
Semiconductor memories: A review. Microprocess. 1 (2) (1976)