Cheng-Geng Huang

Publication Activity (10 Years)

Years Active: 2019-2024
Publications (10 Years): 9

Top Topics

Fault Diagnosis

Domain Adaptation

Top Venues

IEEE Trans. Reliab.

IEEE Trans. Instrum. Meas.

Eng. Appl. Artif. Intell.

Publications

Junyu Guo, Zhiyuan Wang, He Li, Yulai Yang, Cheng-Geng Huang, Mohammad Yazdi, Hooi Siang Kang
A hybrid prognosis scheme for rolling bearings based on a novel health indicator and nonlinear Wiener process. Reliab. Eng. Syst. Saf. 245 (2024)
Jichao Zhuang, Jianhai Yan, Cheng-Geng Huang, Minping Jia
Residual attention temporal recurrent network for fault diagnosis of gearboxes under limited labeled data. Eng. Appl. Artif. Intell. 129 (2024)
Junyu Guo, Zhiyuan Wang, Yulai Yang, Yuhang Song, Jia-Lun Wan, Cheng-Geng Huang
A dual-channel transferable RUL prediction method integrated with Bayesian deep learning and domain adaptation for rolling bearings. Qual. Reliab. Eng. Int. 40 (5) (2024)
Jun Zhu, Yuanfan Wang, Cheng-Geng Huang, Changqing Shen, Bojian Chen
A New Incremental Learning for Bearing Fault Diagnosis Under Noisy Conditions Using Classification and Feature-Level Information. IEEE Trans. Instrum. Meas. 73 (2024)
Jun Zhu, Cheng-Geng Huang, Changqing Shen, Yongjun Shen
Cross-Domain Open-Set Machinery Fault Diagnosis Based on Adversarial Network With Multiple Auxiliary Classifiers. IEEE Trans. Ind. Informatics 18 (11) (2022)
He Li, Mohammad Yazdi, Cheng-Geng Huang, Weiwen Peng
A reliable probabilistic risk-based decision-making method: Bayesian Technique for Order of Preference by Similarity to Ideal Solution (B-TOPSIS). Soft Comput. 26 (22) (2022)
Cheng-Geng Huang, Hong-Zhong Huang, Yan-Feng Li, Weiwen Peng
Fault prognosis using deep convolutional neural network and bootstrap-based method. INDIN (2020)
Cheng-Geng Huang, Xianhui Yin, Hong-Zhong Huang, Yan-Feng Li
An Enhanced Deep Learning-Based Fusion Prognostic Method for RUL Prediction. IEEE Trans. Reliab. 69 (3) (2020)
Cheng-Geng Huang, Hong-Zhong Huang, Yan-Feng Li
A Bidirectional LSTM Prognostics Method Under Multiple Operational Conditions. IEEE Trans. Ind. Electron. 66 (11) (2019)