B. K. Jones

Publication Activity (10 Years)

Years Active: 1988-2002
Publications (10 Years): 0

Publications

B. K. Jones
Logarithmic distributions in reliability analysis. Microelectron. Reliab. 42 (4-5) (2002)
B. K. Jones, C. N. Graham, A. Konczakowska, L. Hasse
The coherence of the gate and drain noise in stressed AlGaAs-InAlGaAs PHEMTs. Microelectron. Reliab. 41 (1) (2001)
A. P. Dorey, B. K. Jones, Andrew Mark David Richardson, P. C. Russell, Y. Z. Xu
Reliability Testing by Precise Electrical Measurement. ITC (1988)