Proceedings of the 2012 ACM SIGCOMM Workshop on Measurements Up the Stack, W-MUST '12, Helsinki, Finland, August 17, 2012

Published in: W-MUST@SIGCOMM (2012)

Keyphrases

special issue
united states of america
computing education
united kingdom
panel discussion
real time
selected papers
database
decision trees
search algorithm
information technology
metadata
information systems
measured data
computer vision
social networks
data sets