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2022 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2022, Hsinchu, Taiwan, April 18-21, 2022

Published in: VLSI-DAT (2022)
Keyphrases
  • international symposium
  • design automation
  • test generation
  • computational intelligence
  • revised papers
  • ambient intelligence
  • computer vision
  • databases
  • image analysis
  • artificial intelligence