Built-In Self-Test of SFQ Circuits Using Side-Channel Leakage Information.

Yerzhan Mustafa Selçuk Köse

Published in: IEEE Trans. Very Large Scale Integr. Syst. (2024)

Keyphrases

information sources
information extraction
high speed
database
image segmentation
image data
information processing
contextual information
semantic information
temporal information
smart card
information overload