VALIDITY INDICES
Experts
- Sanghamitra Bandyopadhyay
- Sriparna Saha
- Erzhou Zhu
- Ahmed Ben Said
- Rui Fa
- Md Zahidul Islam
- Sebti Foufou
- Lucas Vendramin
- Ricardo J. G. B. Campello
- Hongyan Cui
- Feng Liu
- Shihong Yue
- Asoke K. Nandi
- Ujjwal Maulik
- María Martínez-Ballesteros
- Artur Starczewski
- Jorge García-Gutiérrez
- Kuo Zhang
- Miead Tehrani Moayyed
- Rachid Hadjidj
- Djamel A. Zighed
- Eduardo R. Hruschka
- Bogdan Antonescu
- Abul Hashem Beg
- Krista Rizman Zalik
- Myong K. Jeong
- Stefano Basagni
- José María Luna-Romera
- Yunjie Liu
- Bing Li
- Ahmad El Sayed
- Jeen-Shing Wang
- Xuejun Li
- Xu Huang
- Peng Wen
- Julien Velcin
- Yong Zhang
- Hakim Hacid
- Walter Rocchia
Venues
- CoRR
- Pattern Recognit.
- Inf. Sci.
- IEEE Access
- Expert Syst. Appl.
- Appl. Soft Comput.
- IEEE Trans. Fuzzy Syst.
- FUZZ-IEEE
- Pattern Anal. Appl.
- Canadian Conference on AI
- SSDBM
- Neurocomputing
- HPCC/SmartCity/DSS
- Pattern Recognit. Lett.
- IJCNN
- Intell. Data Anal.
- Int. J. Data Min. Bioinform.
- IEEE Trans. Syst. Man Cybern. Part B
- Multim. Tools Appl.
- CEC
- MLSP
- Signal Image Video Process.
- DMKD
- J. Multivar. Anal.
- ICDCIT
- GSCIT
- ICAPR
- DIS
- AAAI
- SDM
- ICICIC (2)
- SMC
- J. Comput. Chem.
- J. Comput. Sci.
- Int. J. Comput. Vis. Robotics
- PKDD
- ICCTA
- Inf.
- ISDA
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