TREND DETECTION
Experts
- Gerd Stumme
- Andreas Hotho
- Tzu-Fu Chiu
- Marti A. Hearst
- Elke A. Rundensteiner
- Yu-Ting Chiu
- Chao-Fu Hong
- Greg Goth
- Bernardo A. Huberman
- Jeffrey C. Carver
- Muhammad Amir Mehmood
- Ponnurangam Kumaraguru
- Nikil D. Dutt
- George Mathew
- Jeremy Kepner
- Michael Jones
- Siddharth Samsi
- Hsinchun Chen
- Benoit Aubert
- Lucila Ohno-Machado
- Bilal Tahir
- Tugrulcan Elmas
- Sitaram Asur
- Rafael Prikladnicki
- Hajime Sasaki
- Suzanne Rivard
- Fayçal Djeffal
- Casper Lassenius
- Albert Reuther
- Christian Boß
- Volker Roth
- Soufia Kausar
- Sudeep Pasricha
- Christian Bauckhage
- Maria R. Lee
- Jiebo Luo
- Peter Michaleas
- Vijay Gadepally
- Tim Menzies
Venues
- CoRR
- Remote. Sens.
- Scientometrics
- IEEE Access
- IEEE Internet Comput.
- IGARSS
- IEEE Commun. Mag.
- IEEE Intell. Syst.
- IEEE Softw.
- Sensors
- Commun. ACM
- ICWSM
- Prax. Inf.verarb. Kommun.
- AMIA
- HICSS
- Inf. Process. Manag.
- IEEE Signal Process. Mag.
- Elektrotech. Informationstechnik
- Computer
- Neurocomputing
- Proc. IEEE
- ITQM
- Microelectron. Reliab.
- IEEE Micro
- IT Prof.
- ICCCNT
- ASONAM
- CCE
- IEEE Netw.
- it Inf. Technol.
- Artif. Intell. Medicine
- ACM Comput. Surv.
- PLoS Comput. Biol.
- J. Am. Soc. Inf. Sci.
- First Monday
- AMCIS
- SMC
- Microelectron. J.
- ISMIS
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