TREC TEST COLLECTIONS
Experts
- Douglas W. Oard
- Ian Soboroff
- Michael D. Ekstrand
- Stewart Whiting
- Joemon M. Jose
- Iadh Ounis
- Ellen M. Voorhees
- Tetsuya Sakai
- Philippe Mulhem
- Gabriela González Sáez
- Xiao Wang
- Suzan Verberne
- David A. Evans
- James Allan
- Dan Roth
- Dirk Lewandowski
- Mark Sanderson
- ChengXiang Zhai
- Krisztian Balog
- Zhicheng Dou
- Jian-Yun Nie
- Kirk Roberts
- Lorraine Goeuriot
- Kareem Darwish
- Ji-Rong Wen
- Nicola Tonellotto
- Graham McDonald
- Petra Galuscáková
- Haoliang Qi
- Shahzad Rajput
- Chen Xing
- Yongjun Xu
- Simone Teufel
- Isaac Johnson
- Craig Macdonald
- Xiaoyang Chen
- Frank F. Xu
- Fabio Crestani
- Asia J. Biega
Venues
- CoRR
- TREC
- SIGIR
- CIKM
- Inf. Process. Manag.
- ECIR
- J. Am. Soc. Inf. Sci.
- CLEF
- ICASSP
- ICTIR
- ACM Trans. Inf. Syst.
- J. Assoc. Inf. Sci. Technol.
- RIAO
- CLEF (Working Notes)
- FIRE
- ICML
- NTCIR
- AMIA
- Inf. Retr.
- IIR
- SIGIR Forum
- INEX
- ACL (1)
- IGARSS
- CLEF (Online Working Notes/Labs/Workshop)
- IEEE Data Eng. Bull.
- J. Inf. Sci.
- HLT-NAACL
- COLING
- WWW (Companion Volume)
- J. Inf. Data Manag.
- JURIX
- SMERP@ECIR
- Systems and Computers in Japan
- ECCV (4)
- JASIS
- PSIVT
- NAACL-HLT
- J. Vis. Commun. Image Represent.
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