TRAINED CLASSIFIERS
Experts
- Jinwoo Shin
- Robert Sabourin
- Loris Nanni
- Peter I. Rockett
- Maria Carolina Monard
- Boguslaw Cyganek
- David J. Miller
- George Kesidis
- Ronaldo C. Prati
- Araceli Sanchis
- Zhen Xiang
- Jongheon Jeong
- Agapito Ledezma
- Honglak Lee
- Gianluigi Folino
- Flávia Cristina Bernardini
- José Salvador Sánchez
- Patrick Cardinal
- Sakrapee Paisitkriangkrai
- Ufuk Topcu
- Johannes Rausch
- Gonzalo Martínez-Muñoz
- Giovanni Acampora
- Anton van den Hengel
- Heung-Chang Lee
- Michal Kruk
- Ulf Johansson
- Peng Wang
- Abdollah Dehzangi
- Kibok Lee
- Mohammad Reza Karimi
- M. Paz Sesmero Lorente
- Sejun Park
- Luiz E. Soares de Oliveira
- Philipp Oberdiek
- Sotiris B. Kotsiantis
- Arkanath Pathak
- Christian Wöhler
- Somnuk Phon-Amnuaisuk
Venues
- CoRR
- IJCNN
- Neurocomputing
- Expert Syst. Appl.
- Pattern Recognit.
- ICASSP
- EuroGP
- IEEE Access
- FLAIRS Conference
- ECAI
- SMC
- KES
- Pattern Anal. Appl.
- AISTATS
- FUZZ-IEEE
- ISBI
- IEEE Trans. Cybern.
- NIPS
- AAAI
- ICLR
- J. Biomed. Informatics
- Comput. Stat. Data Anal.
- Medical Imaging: Computer-Aided Diagnosis
- Neural Comput. Appl.
- IEEE Congress on Evolutionary Computation
- IEEE Trans. Pattern Anal. Mach. Intell.
- USENIX Security Symposium
- Neural Comput.
- CVPR
- MILCOM
- Artif. Intell. Rev.
- SIGMOD Conference
- Sensors
- ICPR
- Pattern Recognit. Lett.
- EMBC
- WILF
- IEEE Trans. Neural Networks
- HIS
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