TRAINED CLASSIFIERS
Experts
- Robert Sabourin
- Jinwoo Shin
- Loris Nanni
- Agapito Ledezma
- David J. Miller
- Ronaldo C. Prati
- Gianluigi Folino
- George Kesidis
- Maria Carolina Monard
- Zhen Xiang
- Peter I. Rockett
- Honglak Lee
- Flávia Cristina Bernardini
- Jongheon Jeong
- Araceli Sanchis
- Boguslaw Cyganek
- Ulf Johansson
- Suman Jana
- Andreas Krause
- Yizheng Chen
- Adenilton J. da Silva
- Simon Günter
- Horst Bunke
- Piotr Teterwak
- Nicholas Dufour
- Michael C. Mozer
- Shiqi Wang
- Stanislaw Osowski
- Byungwoo Lee
- José Salvador Sánchez
- Daniel Hernández-Lobato
- Ioannis P. Vlahavas
- Matthias Rottmann
- Yoav Freund
- Luciano Sánchez
- Sungha Choi
- Peng Wang
- Ismael C. S. Araujo
- Edwin Lughofer
Venues
- CoRR
- IJCNN
- Neurocomputing
- Expert Syst. Appl.
- IEEE Access
- EuroGP
- ICASSP
- Pattern Recognit.
- Pattern Anal. Appl.
- KES
- AISTATS
- ECAI
- FUZZ-IEEE
- FLAIRS Conference
- SMC
- USENIX Security Symposium
- WILF
- IEEE Trans. Pattern Anal. Mach. Intell.
- Comput. Stat. Data Anal.
- MILCOM
- Medical Imaging: Computer-Aided Diagnosis
- HIS
- ISBI
- ICPR
- Artif. Intell. Rev.
- IEEE Congress on Evolutionary Computation
- SIGMOD Conference
- IEEE Trans. Cybern.
- IEEE Trans. Neural Networks
- Pattern Recognit. Lett.
- EMBC
- CVPR
- NIPS
- Neural Comput.
- ICLR
- AAAI
- J. Biomed. Informatics
- Sensors
- Neural Comput. Appl.
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