TEXTURE INFORMATION
Experts
- Matti Pietikäinen
- Michal Haindl
- P. Nagabhushan
- Alice Porebski
- Guoying Zhao
- Nicolas Vandenbroucke
- Loris Nanni
- Tieniu Tan
- Shervan Fekri Ershad
- Alessandra Lumini
- Mohammed Javed
- David Zhang
- Thrasyvoulos N. Pappas
- André Ricardo Backes
- Paul W. Fieguth
- Sheryl Brahnam
- Maria Petrou
- Aaron Fenster
- Yong Man Ro
- Li Liu
- Umapada Pal
- Abdenour Hadid
- Vojtech Havlícek
- Paolo Napoletano
- Gerald Schaefer
- Ahmed Bouridane
- Topi Mäenpää
- Shogo Okamoto
- B. B. Chaudhuri
- Jesús Chamorro-Martínez
- Francesco Bianconi
- Seungmoon Choi
- Antonio Fernández
- Yoji Yamada
- Glenn Healey
- Niraj P. Doshi
- Daniel Cohen-Or
- Raimondo Schettini
- Ludovic Macaire
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- Pattern Recognit.
- ICPR
- Pattern Recognit. Lett.
- IGARSS
- IEEE Access
- ICASSP
- IEEE Trans. Image Process.
- CVPR
- J. Electronic Imaging
- Medical Imaging: Image Processing
- Expert Syst. Appl.
- ISBI
- Comput. Graph. Forum
- Remote. Sens.
- Vis. Comput.
- BMVC
- EUSIPCO
- Neurocomputing
- Sensors
- Image Vis. Comput.
- ICIP (3)
- Medical Imaging: Computer-Aided Diagnosis
- IEEE Trans. Geosci. Remote. Sens.
- ICCV
- ACM Trans. Graph.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IJCNN
- SMC
- Int. J. Pattern Recognit. Artif. Intell.
- J. Vis. Commun. Image Represent.
- SITIS
- ICME
- EMBC
- Signal Process.
- IEEE Geosci. Remote. Sens. Lett.
- Comput. Vis. Image Underst.
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