TEXTURE FEATURES
Experts
- Matti Pietikäinen
- David Zhang
- Odemir Martinez Bruno
- Guoying Zhao
- Anil K. Jain
- Tieniu Tan
- Ahmed Bouridane
- André Ricardo Backes
- João Batista Florindo
- Thrasyvoulos N. Pappas
- Maria Petrou
- Lei Zhang
- Domenec Puig
- Li Liu
- Andreas Uhl
- Paul W. Fieguth
- Odemir M. Bruno
- Michal Haindl
- Abdenour Hadid
- Constantinos S. Pattichis
- Francesco Bianconi
- Seungmoon Choi
- Wen Gao
- Rangaraj M. Rangayyan
- Yongsheng Dong
- Yannick Berthoumieu
- Wesley Nunes Gonçalves
- Alice Porebski
- Loris Nanni
- Adrien Depeursinge
- Josef Kittler
- Nicolas Vandenbroucke
- Jane You
- Partha Pratim Roy
- Shogo Okamoto
- Georgy L. Gimel'farb
- Yassine Ruichek
- Mita Nasipuri
- U. Rajendra Acharya
Venues
- CoRR
- ICIP
- Pattern Recognit.
- Multim. Tools Appl.
- ICPR
- ICASSP
- Pattern Recognit. Lett.
- IEEE Access
- IEEE Trans. Image Process.
- IGARSS
- Remote. Sens.
- Sensors
- Expert Syst. Appl.
- CVPR
- Neurocomputing
- J. Electronic Imaging
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Medical Imaging: Computer-Aided Diagnosis
- EUSIPCO
- EMBC
- Medical Imaging: Image Processing
- Biomed. Signal Process. Control.
- ICIP (3)
- ISBI
- Comput. Graph. Forum
- Image Vis. Comput.
- Vis. Comput.
- BMVC
- IEEE Geosci. Remote. Sens. Lett.
- Int. J. Pattern Recognit. Artif. Intell.
- IJCNN
- SMC
- J. Vis. Commun. Image Represent.
- IET Image Process.
- ICCV
- ICIP (2)
- Comput. Vis. Image Underst.
- SIU
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