TECHNOLOGICAL ADVANCES
Experts
- Jay F. Nunamaker Jr.
- Kinji Mori
- Jim Ryan
- Kelly Rainer
- Mark N. Frolick
- Peter G. Neumann
- Hugh J. Watson
- Robert O. Briggs
- Jan Niehues
- Xiaodong Lu
- Theo Theocharides
- Yao-Wen Chang
- Mohammed Mediani
- Alex Waibel
- Yvonne Rogers
- Mitsumasa Koyanagi
- Rick Kazman
- Teresa Herrmann
- André Ivanov
- Steven C. Reising
- Bruce C. Kim
- Sharmila Padmanabhan
- Eunah Cho
- Tugrul U. Daim
- Wesley K. Berg
- Hussam Amrouch
- Takafumi Fukushima
- Sara J. Czaja
- Francesco Osborne
- Falk Schreiber
- Daniel D. Garcia
- Bernd Heinemann
- Sorin P. Voinigescu
- Kuan-Neng Chen
- Zhimeng Yin
- Christopher A. Le Dantec
- Stephen J. Andriole
- Malgorzata Marek-Sadowska
- Stefan Henningsson
Venues
- CoRR
- Sensors
- HICSS
- Computer
- IEEE Access
- Proc. IEEE
- Scientometrics
- Int. J. Technol. Manag.
- Commun. ACM
- CHI Extended Abstracts
- J. Electron. Test.
- IEEE Commun. Mag.
- CHI
- IEEE J. Solid State Circuits
- ICIS
- AI Soc.
- Technol. Anal. Strateg. Manag.
- IEEE Technol. Soc. Mag.
- Microelectron. Reliab.
- AMCIS
- DAC
- IEEE Trans. Engineering Management
- ISTAS
- IGARSS
- IEEE Des. Test Comput.
- Interactions
- Remote. Sens.
- IBM J. Res. Dev.
- Comput. Law Secur. Rev.
- PACIS
- Comput. Hum. Behav.
- SIGUCCS
- OFC
- ECIS
- IRPS
- ICMC
- ACM SIGSOFT Softw. Eng. Notes
- ITC
- SMC
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend