SUPERVISED CLASSIFIERS
Experts
- José Francisco Martínez Trinidad
- Lorenzo Bruzzone
- Erik Cambria
- José Antonio Lozano
- Iñaki Inza
- Aritz Pérez
- Masashi Sugiyama
- Santiago Mazuelas
- Jiwon Kim
- Maurizio Morisio
- Muhammad Zubair Asghar
- Heyan Huang
- Jesús Ariel Carrasco-Ochoa
- Shakeel Ahmad
- Engelbert Mephu Nguifo
- Kwangrok Ryoo
- Pierre Comon
- Junyoung Seo
- Erion Çano
- Andreas Dengel
- Andrés Eduardo Gutiérrez-Rodríguez
- Stéphane Girard
- Sebastiano B. Serpico
- Gyuseong Lee
- Pushpak Bhattacharyya
- Xianling Mao
- Man Lan
- Francisco Herrera
- Hansang Cho
- Milton García-Borroto
- Ali Amiryousefi
- Mineichi Kudo
- Rogelio Salinas-Gutiérrez
- Seungryong Kim
- Basilio Sierra
- Gabriele Moser
- Begüm Demir
- Daehwan Kim
- Dan Wang
Venues
- CoRR
- IGARSS
- IEEE Access
- SemEval@NAACL-HLT
- Remote. Sens.
- Pattern Recognit. Lett.
- IJCNN
- Sensors
- IEEE Trans. Geosci. Remote. Sens.
- Inf. Sci.
- Inf. Process. Manag.
- Multim. Tools Appl.
- SemEval@COLING
- ICASSP
- Pattern Recognit.
- Int. J. Appl. Earth Obs. Geoinformation
- ICDM Workshops
- Knowl. Based Syst.
- LREC
- Expert Syst. Appl.
- ICPR
- ECIR
- Soft Comput.
- CIKM
- Soc. Netw. Anal. Min.
- IberLEF@SEPLN
- NLDB
- J. Classif.
- CIARP
- BMC Bioinform.
- SemEval@ACL
- CVPR
- MICAI (2)
- ICME
- IEEE BigData
- IEEE Trans. Pattern Anal. Mach. Intell.
- COLING
- RANLP
- MCPR
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