SUPERVISED CLASSIFIERS
Experts
- José Francisco Martínez Trinidad
- Lorenzo Bruzzone
- Erik Cambria
- Aritz Pérez
- José Antonio Lozano
- Masashi Sugiyama
- Iñaki Inza
- Muhammad Zubair Asghar
- Junyoung Seo
- Man Lan
- Hansang Cho
- Pierre Comon
- Dan Wang
- Begüm Demir
- Ali Amiryousefi
- Santiago Mazuelas
- Erion Çano
- Sebastiano B. Serpico
- Xianling Mao
- Heyan Huang
- Gabriele Moser
- Engelbert Mephu Nguifo
- Kwangrok Ryoo
- Stéphane Girard
- Daehwan Kim
- Andreas Dengel
- Jiwon Kim
- Gyuseong Lee
- Basilio Sierra
- Milton García-Borroto
- Seungryong Kim
- Mineichi Kudo
- Andrés Eduardo Gutiérrez-Rodríguez
- Pushpak Bhattacharyya
- Rogelio Salinas-Gutiérrez
- Francisco Herrera
- Jesús Ariel Carrasco-Ochoa
- Shakeel Ahmad
- Maurizio Morisio
Venues
- CoRR
- IGARSS
- SemEval@NAACL-HLT
- IEEE Access
- Remote. Sens.
- Pattern Recognit. Lett.
- IEEE Trans. Geosci. Remote. Sens.
- IJCNN
- Inf. Sci.
- Sensors
- Inf. Process. Manag.
- Multim. Tools Appl.
- SemEval@COLING
- ICASSP
- Pattern Recognit.
- ICDM Workshops
- Int. J. Appl. Earth Obs. Geoinformation
- LREC
- Expert Syst. Appl.
- Knowl. Based Syst.
- SemEval@ACL
- CIARP
- Soc. Netw. Anal. Min.
- CVPR
- IberLEF@SEPLN
- J. Classif.
- BMC Bioinform.
- ECIR
- MICAI (2)
- NLDB
- ICPR
- CIKM
- Soft Comput.
- Comput. Electr. Eng.
- Environ. Model. Softw.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICIP
- RANLP
- Canadian Conference on AI
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