STRUCTURING ELEMENTS
Experts
- Jesús Angulo
- Isabelle Bloch
- Edward R. Dougherty
- Henk J. A. M. Heijmans
- Peter Sussner
- Gaudenzio Meneghesso
- Santiago Velasco-Forero
- Ryan Cotterell
- Ioannis Pitas
- Nizar Habash
- Enrico Zanoni
- Dan Schonfeld
- Hugues Talbot
- Laurent Najman
- Robert M. Haralick
- Matteo Meneghini
- Stephen Marshall
- Petros Maragos
- Jean Serra
- Junior Barrera
- Sébastien Lefèvre
- Marcos Eduardo Valle
- Pierre Soille
- Frank Y. Shih
- Fernand Meyer
- Petr Dokládal
- Makoto Nakashizuka
- Etienne E. Kerre
- Mans Hulden
- Katharina Kann
- Jos B. T. M. Roerdink
- Roberto de Alencar Lotufo
- Michael H. F. Wilkinson
- Cris L. Luengo Hendriks
- Yrjö Neuvo
- Anastasios N. Venetsanopoulos
- Jean Cousty
- Akira Asano
- Erchan Aptoula
Venues
- CoRR
- ISMM
- IEEE Trans. Image Process.
- IEEE Access
- ICIP
- Pattern Recognit.
- ICASSP
- Microelectron. Reliab.
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICPR
- J. Math. Imaging Vis.
- EUSIPCO
- LREC
- IGARSS
- Signal Process.
- J. Electronic Imaging
- Multim. Tools Appl.
- Microelectron. J.
- Remote. Sens.
- CVPR
- IRPS
- Sensors
- SIBGRAPI
- IEEE Trans. Medical Imaging
- J. Vis. Commun. Image Represent.
- ISBI
- ICIP (3)
- IEEE Trans. Geosci. Remote. Sens.
- Medical Imaging: Image Processing
- ICDAR
- INTERSPEECH
- ICIP (2)
- IEEE Trans. Signal Process.
- SIGMORPHON
- DRC
- ICCV
- DGCI
- Image Vis. Comput.
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