SINGLE SCALE
Experts
- Tony Lindeberg
- Theo Gevers
- Joost van de Weijer
- Yu-Ping Wang
- Akira Taguchi
- Simone Bianco
- Qiang Wu
- Baowei Lin
- Raimondo Schettini
- Noureddine Ellouze
- Arjan Gijsenij
- Kenneth R. Castleman
- Jae Ho Jang
- Jong Beom Ra
- Alan C. Bovik
- Ylva Jansson
- Vicent Caselles
- Yashar Mehmani
- Witold Kinsner
- Zixiang Xiong
- Hamdi A. Tchelepi
- Rebecca Willett
- Nam Chul Kim
- Stéphane Mallat
- José Luis Vázquez Noguera
- Preben Gråberg Nes
- Nitya Tiwari
- Sifen Zhong
- William J. Kaiser
- Haiyong Zheng
- Xianzhi Du
- Shufan Li
- Youngmi Hur
- Yi Lin
- Boyan S. Lazarov
- Yi-Fei Pu
- Fan Yang
- Wathiq Mansoor
- Mingyi He
Venues
- CoRR
- ICIP
- ICASSP
- IEEE Trans. Image Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Signal Process.
- IEEE Access
- Multim. Tools Appl.
- Pattern Recognit. Lett.
- CVPR
- ICPR
- IET Image Process.
- IEEE Trans. Geosci. Remote. Sens.
- J. Math. Imaging Vis.
- Remote. Sens.
- Multiscale Model. Simul.
- ICIP (3)
- Entropy
- IEEE Trans. Medical Imaging
- EUSIPCO
- Pattern Recognit.
- J. Comput. Phys.
- IEEE Trans. Vis. Comput. Graph.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- IEEE Trans. Biomed. Eng.
- J. Electronic Imaging
- IEEE Signal Process. Lett.
- ICCV
- Image Vis. Comput.
- ICIP (1)
- Scale-Space
- IGARSS
- IEEE Trans. Signal Process.
- ICIP (2)
- EMBC
- Vis. Comput.
- Sensors
- Color Imaging Conference
- Neural Networks
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