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Experts
- Faisal Shafait
- C. V. Jawahar
- Chew Lim Tan
- David S. Doermann
- Umapada Pal
- Basilios Gatos
- Thomas M. Breuel
- Jean-Marc Ogier
- Venu Govindaraju
- Jun Sun
- Qiang Huo
- Nibaran Das
- Stavros J. Perantonis
- Kaushik Roy
- Ioannis Pratikakis
- Satoshi Naoi
- Dimosthenis Karatzas
- Utpal Garain
- Rafael Dueire Lins
- Jan P. Allebach
- Shijian Lu
- Graham Leedham
- Amrith Krishna
- Ram Sarkar
- Seiichi Uchida
- A. G. Ramakrishnan
- Hirobumi Nishida
- Phyo Thu Thu Khine
- Elena Andreeva
- Michael Backes
- Khin Nwe Ni Tun
- Nasir D. Memon
- Showmik Bhowmik
- Chandana Dinesh Parape
- Chien-Cheng Tseng
- Mita Nasipuri
- Edward J. Delp
- Million Meshesha
- Allan C. Madoc
Venues
- ICDAR
- CoRR
- ICIP
- Sensors
- DRR
- Int. J. Document Anal. Recognit.
- IEEE Trans. Image Process.
- Document Analysis Systems
- Pattern Recognit.
- IEEE Access
- ICPR
- J. Electronic Imaging
- ICFHR
- ICMV
- ICIP (3)
- Color Imaging Conference
- ISCAS
- ICASSP
- ICVGIP
- CVPR
- ICIAR
- Document Recognition
- MVA
- PICS
- ICDAR Workshops (2)
- ICIP (2)
- Multim. Tools Appl.
- IEEE SENSORS
- Color Imaging: Displaying, Processing, Hardcopy, and Applications
- Int. J. Pattern Recognit. Artif. Intell.
- IET Image Process.
- ICPR (2)
- ACM Symposium on Document Engineering
- IWFHR
- DocEng
- IQSP
- CVGIP Graph. Model. Image Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- CGIV
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